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Igor Kozhevnikov, Igor V. Kozhevnikov, Игорь Викторович Кожевников
Igor Kozhevnikov, Igor V. Kozhevnikov, Игорь Викторович Кожевников
Shubnikov Institute of Crystallography of the Russian Academy of Sciences
Verified email at crys.ras.ru
Title
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Cited by
Year
Design of X-ray supermirrors
IV Kozhevnikov, IN Bukreeva, E Ziegler
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
1382001
Зеркальная рентгеновская оптика
ВАС А.В. Виноградов, И.А. Брытов, А.Я. Грудский, М.Т. Коган, И.В. Кожевников
Ленинград, Машиностроение, 1989
115*1989
Thermal stability of soft x-ray Mo-Si and MoSi2-Si multilayer mirrors
VV Kondratenko, Yu P Pershin, OV Poltseva, A I Fedorenko, EN Zubarev, SA ...
Applied Optics 32 (10), 1811-1816, 1993
871993
Application of X-ray scattering technique to the study of supersmooth surfaces
VE Asadchikov, IV Kozhevnikov, YS Krivonosov, R Mercier, TH Metzger, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2004
772004
Physical analysis of the inverse problem of X-ray reflectometry
IV Kozhevnikov
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2003
752003
Basic formulae of XUV multilayer optics
IV Kozhevnikov, AV Vinogradov
Physica Scripta 1987 (T17), 137, 1987
691987
Phenomenon of total external reflection of x rays
AV Vinogradov, NN Zorev, IV Kozhevnikov, IG Yakushkin
Zh. Eksp. Teor. Fiz 89, 2124-2132, 1985
66*1985
Design and fabrication of depth-graded X-ray multilayers
C Morawe, E Ziegler, JC Peffen, IV Kozhevnikov
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002
602002
Development of a self-consistent free-form approach for studying the three-dimensional morphology of a thin film
IV Kozhevnikov, L Peverini, E Ziegler
Physical Review B 85 (12), 125439, 2012
582012
Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy
VE Asadchikov, A Duparré, S Jakobs, AY Karabekov, IV Kozhevnikov, ...
Applied Optics 38 (4), 684-691, 1999
581999
Use of DWBA and perturbation theory in X-ray control of the surface roughness
IV Kozhevnikov, MV Pyatakhin
Journal of X-ray science and technology 8 (4), 253-275, 1998
541998
Properties of broadband depth-graded multilayer mirrors for EUV optical systems
AE Yakshin, IV Kozhevnikov, E Zoethout, E Louis, F Bijkerk
Optics express 18 (7), 6957-6971, 2010
382010
Roughness conformity during tungsten film growth: An in situ synchrotron x-ray scattering study
L Peverini, E Ziegler, T Bigault, I Kozhevnikov
Physical Review B 72 (4), 045445, 2005
372005
Synthesis and measurement of normal incidence X-ray multilayer mirrors optimized for a photon energy of 390 eV
IV Kozhevnikov, AI Fedorenko, VV Kondratenko, YP Pershin, SA Yulin, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1994
371994
Enhancement of soft X-ray reflectivity and interface stability in nitridated Pd/Y multilayer mirrors
D Xu, Q Huang, Y Wang, P Li, M Wen, P Jonnard, A Giglia, ...
Optics Express 23 (26), 33018-33026, 2015
352015
X-ray scattering by highly polished surfaces
AV Vinogradov, NN Zorev, IV Kozhevnikov, SI Sagitov, AG Tur'yanskii
Zh. Eksp. Teor. Fiz 94, 216, 1988
34*1988
Wideband multilayer mirrors with minimal layer thicknesses variation
IV Kozhevnikov, AE Yakshin, F Bijkerk
Optics express 23 (7), 9276-9283, 2015
332015
Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2 (Ti)/SiO2/Si stacks
EO Filatova, IV Kozhevnikov, AA Sokolov, EV Ubyivovk, S Yulin, M Gorgoi, ...
Science and Technology of Advanced Materials, 2012
322012
High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime
IV Kozhevnikov, R Van Der Meer, HMJ Bastiaens, KJ Boller, F Bijkerk
Optics express 18 (15), 16234-16242, 2010
322010
Investigation of the structure of thin HfO2 films by soft x-ray reflectometry techniques
EO Filatova, AA Sokolov, IV Kozhevnikov, EY Taracheva, OS Grunsky, ...
Journal of Physics: Condensed Matter 21 (18), 185012, 2009
312009
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