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Aida Todri-Sanial
Aida Todri-Sanial
Director of Research, CNRS
Verified email at lirmm.fr - Homepage
Title
Cited by
Cited by
Year
A study of tapered 3-D TSVs for power and thermal integrity
A Todri, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (2), 306-319, 2012
842012
Carbon Nanotubes for Interconnects
A Todri-Sanial, J Dijon, A Maffucci
Springer, 2017
732017
Energy autonomous wearable sensors for smart healthcare: a review
AS Dahiya, J Thireau, J Boudaden, S Lal, U Gulzar, Y Zhang, T Gil, ...
Journal of The Electrochemical Society 167 (3), 037516, 2019
622019
Multiple cell upset classification in commercial SRAMs
G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ...
IEEE Transactions on Nuclear Science 61 (4), 1747-1754, 2014
552014
Testing a commercial MRAM under neutron and alpha radiation in dynamic mode
G Tsiligiannis, L Dilillo, A Bosio, P Girard, A Todri, A Virazel, SS McClure, ...
IEEE Transactions on Nuclear Science 60 (4), 2617-2622, 2013
412013
Addressing the thermal issues of STT-MRAM from compact modeling to design techniques
L Zhang, Y Cheng, W Kang, L Torres, Y Zhang, A Todri-Sanial, W Zhao
IEEE Transactions on Nanotechnology 17 (2), 345-352, 2018
382018
Temperature impact analysis and access reliability enhancement for 1T1MTJ STT-RAM
B Wu, Y Cheng, J Yang, A Todri-Sanial, W Zhao
IEEE Transactions on Reliability 65 (4), 1755-1768, 2016
382016
A survey of carbon nanotube interconnects for energy efficient integrated circuits
A Todri-Sanial, R Ramos, H Okuno, J Dijon, A Dhavamani, M Widlicenus, ...
IEEE Circuits and Systems Magazine 17 (2), 47-62, 2017
332017
A hardware-aware heuristic for the qubit mapping problem in the nisq era
S Niu, A Suau, G Staffelbach, A Todri-Sanial
IEEE Transactions on Quantum Engineering 1, 1-14, 2020
312020
A functional power evaluation flow for defining test power limits during at-speed delay testing
M Valka, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, A Virazel, ...
2011 Sixteenth IEEE European Test Symposium, 153-158, 2011
292011
Exploring the impact of functional test programs re-used for power-aware testing
A Touati, A Bosio, L Dilillo, P Girard, A Virazel, P Bernardi, MS Reorda
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
262015
Power supply noise aware workload assignment for multi-core systems
A Todri, M Marek-Sadowska, J Kozhaya
2008 IEEE/ACM International Conference on Computer-Aided Design, 330-337, 2008
252008
Physical Design for 3D Integrated Circuits
A Todri-Sanial, CS Tan
CRC Press, 2017
212017
Globally constrained locally optimized 3-D power delivery networks
A Todri-Sanial, S Kundu, P Girard, A Bosio, L Dilillo, A Virazel
IEEE Transactions on very large scale Integration (VLSI) Systems 22 (10 …, 2013
212013
A study of decoupling capacitor effectiveness in power and ground grid networks
A Todri, M Marek-Sadowska, F Maire, C Matheron
2009 10th International Symposium on Quality Electronic Design, 653-658, 2009
202009
A hybrid fault tolerant architecture for robustness improvement of digital circuits
DA Tran, A Virazel, A Bosio, L Dilillo, P Girard, S Pravossoudovitch, ...
2011 Asian Test Symposium, 136-141, 2011
192011
Electrothermal analysis of carbon nanotubes power delivery networks for nanoscale integrated circuits
A Magnani, M De Magistris, A Todri-Sanial, A Maffucci
IEEE Transactions on Nanotechnology 15 (3), 380-388, 2016
172016
An SRAM based monitor for mixed-field radiation environments
G Tsiligiannis, L Dilillo, A Bosio, P Girard, S Pravossoudovitch, A Todri, ...
IEEE Transactions on Nuclear Science 61 (4), 1663-1670, 2014
172014
A complete resistive-open defect analysis for thermally assisted switching MRAMs
J Azevedo, A Virazel, A Bosio, L Dilillo, P Girard, A Todri-Sanial, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (11 …, 2014
172014
Why and how controlling power consumption during test: a survey
A Bosio, L Dilillo, P Girard, A Todri, A Virazel
2012 IEEE 21st Asian Test Symposium, 221-226, 2012
162012
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