| Principles of near-field microwave microscopy SM Anlage, VV Talanov, AR Schwartz Scanning probe microscopy: electrical and electromechanical phenomena at the …, 2007 | 301 | 2007 |
| Microwave electrodynamics of electron-doped cuprate superconductors JD Kokales, P Fournier, LV Mercaldo, VV Talanov, RL Greene, ... Physical Review Letters 85 (17), 3696, 2000 | 167 | 2000 |
| A near-field scanned microwave probe for spatially localized electrical metrology VV Talanov, A Scherz, RL Moreland, AR Schwartz Applied physics letters 88 (13), 2006 | 86 | 2006 |
| Superconducting transmission driver system QP Herr, E Rudman, JD Egan, VV Talanov US Patent 10,236,869, 2019 | 47 | 2019 |
| Near-field scanning microwave microscope for interline capacitance characterization of nanoelectronics interconnect VV Talanov, AR Schwartz IEEE transactions on microwave theory and techniques 57 (5), 1224-1229, 2009 | 43 | 2009 |
| Few-layer graphene characterization by near-field scanning microwave microscopy VV Talanov, CD Barga, L Wickey, I Kalichava, E Gonzales, EA Shaner, ... Acs Nano 4 (7), 3831-3838, 2010 | 39 | 2010 |
| Quantitative model for near-field scanning microwave microscopy: Application to metrology of thin film dielectrics AN Reznik, VV Talanov Review of Scientific Instruments 79 (11), 2008 | 39 | 2008 |
| Near-field microwave microscope with improved sensitivity and spatial resolution A Tselev, SM Anlage, HM Christen, RL Moreland, VV Talanov, ... Review of scientific instruments 74 (6), 3167-3170, 2003 | 38 | 2003 |
| Measurement of the absolute penetration depth and surface resistance of superconductors and normal metals with the variable spacing parallel plate resonator VV Talanov, LV Mercaldo, SM Anlage, JH Claassen Review of Scientific Instruments 71 (5), 2136-2146, 2000 | 38 | 2000 |
| Apparatus for localized measurements of complex permittivity of a material VV Talanov, HM Christen, R Moreland US Patent 6,597,185, 2003 | 37 | 2003 |
| Noncontact dielectric constant metrology of low-k interconnect films using a near-field scanned microwave probe VV Talanov, A Scherz, RL Moreland, AR Schwartz Applied physics letters 88 (19), 2006 | 36 | 2006 |
| Reproducible operating margins on a 72 800-device digital superconducting chip QP Herr, J Osborne, MJA Stoutimore, H Hearne, R Selig, J Vogel, E Min, ... Superconductor Science and Technology 28 (12), 124003, 2015 | 32 | 2015 |
| Parallel-plate resonator of variable spacer thickness for accurate measurements of surface impedance of high-T c superconductive films AY Basovich, RK Belov, VA Markelov, LA Mazo, SA Pavlov, VV Talanov, ... Journal of superconductivity 5, 497-502, 1992 | 23 | 1992 |
| Scanning probe microscopy SM Anlage, VV Talanov, AR Schwartz Principles of Near-Field Microwave Microscopy 1 (7), 2007 | 22 | 2007 |
| High resolution magnetic current imaging for die level short localization J Gaudestad, N Gagliolo, VV Talanov, RH Yeh, CJ Ma Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013 | 19 | 2013 |
| Apertured probes for localized measurements of a material's complex permittivity and fabrication method RL Moreland, HM Christen, VV Talanov, AR Schwartz US Patent 6,680,617, 2004 | 19 | 2004 |
| Clock distribution network for a superconducting integrated circuit VV Talanov, JA Strong US Patent 9,722,589, 2017 | 18 | 2017 |
| System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes VV Talanov, RL Moreland, AR Schwartz, HM Christen US Patent 6,856,140, 2005 | 18 | 2005 |
| Microstructure and electrical properties of YBCO films YN Drozdov, SV Gaponov, SA Gusev, EB Kluenkov, YN Nozdrin, ... Superconductor Science and Technology 9 (4A), A166, 1996 | 18 | 1996 |
| Space Domain Reflectometry for open failure localization J Gaudestad, V Talanov, N Gagliolo, A Orozco 2012 19th IEEE International Symposium on the Physical and Failure Analysis …, 2012 | 17 | 2012 |
Steven M. AnlageUniversity of MarylandVerified email at umd.edu
