| Diode-triggered SCR (DTSCR) for RF-ESD protection of BiCMOS SiGe HBTs and CMOS ultra-thin gate oxides MPJ Mergens, CC Russ, KG Verhaege, J Armer, PC Jozwiak, R Mohn, ... IEEE International Electron Devices Meeting 2003, 21.3. 1-21.3. 4, 2003 | 125 | 2003 |
| Method and apparatus for improved ESD performance B Van Camp, G Vermont, B Keppens US Patent App. 11/451,188, 2007 | 124 | 2007 |
| Speed optimized diode-triggered SCR (DTSCR) for RF ESD protection of ultra-sensitive IC nodes in advanced technologies MPJ Mergens, CC Russ, KG Verhaege, J Armer, PC Jozwiak, RP Mohn, ... IEEE Transactions on Device and Materials Reliability 5 (3), 532-542, 2005 | 116 | 2005 |
| ESD protection solutions for high voltage technologies B Keppens, MPJ Mergens, CS Trinh, CC Russ, B Van Camp, ... 2004 Electrical overstress/Electrostatic discharge symposium, 1-10, 2004 | 114 | 2004 |
| Minimum-dimension, fully-silicided MOS driver and ESD protection design for optimized inter-finger coupling MPJ Mergens, KGM Verhaege, CC Russ, J Armer, PC Jozwiak, ... US Patent 7,005,708, 2006 | 104 | 2006 |
| Design and analysis of new protection structures for smart power technology with controlled trigger and holding voltage V De Heyn, G Groeseneken, B Keppens, M Natarajan, L Vacaresse, ... 2001 IEEE International Reliability Physics Symposium Proceedings. 39th …, 2001 | 66 | 2001 |
| Influence of gate length on ESD-performance for deep sub micron CMOS technology K Bock, B Keppens, V De Heyn, G Groeseneken, LY Ching, A Naem Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 …, 1999 | 65 | 1999 |
| SCR-based ESD protection in nanometer SOI technologies O Marichal, G Wybo, B Van Camp, P Vanysacker, B Keppens Microelectronics Reliability 47 (7), 1060-1068, 2007 | 34 | 2007 |
| Active-area-segmentation (AAS) technique for compact, ESD robust, fully silicided NMOS design B Keppens, MPJ Mergens, J Armer, PC Jozwiak, G Taylor, R Mohn, ... 2003 Electrical Overstress/Electrostatic Discharge Symposium, 1-9, 2003 | 34 | 2003 |
| Method and apparatus for providing current controlled electrostatic discharge protection B Van Camp, F De Ranter, G Wybo, B Keppens US Patent 7,110,230, 2006 | 32 | 2006 |
| Esd clamp control by detection of power state B Keppens, B Van Camp, A Bens, P Vanysacker, S Thijs US Patent App. 11/737,469, 2007 | 30 | 2007 |
| Contributions to standardization of transmission line pulse testing methodology B Keppens, V De Heyn, MN Iyer, G Groeseneken 2001 Electrical Overstress/Electrostatic Discharge Symposium, 456-462, 2001 | 26 | 2001 |
| ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies M Mergens, G Wybo, B Van Camp, B Keppens, F De Ranter, K Verhaege, ... 2005 IEEE International Symposium on Circuits and Systems, 1194-1197, 2005 | 24 | 2005 |
| Method and aparatus for improved electrostatic discharge protection P Vanysacker, O Marichal, B Sorgeloos, B Van Camp, B Keppens, ... US Patent App. 12/043,206, 2008 | 23 | 2008 |
| Method and apparatus for protecting a gate oxide using source/bulk pumping MPJ Mergens, FMD De Ranter, B Van Camp, KGM Verhaege, ... US Patent 7,233,467, 2007 | 21 | 2007 |
| Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies M Mergens, J Armer, P Jozwiak, B Keppens, F De Ranter, K Verhaege, ... Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat …, 2004 | 19 | 2004 |
| Device having a low-voltage trigger element MPJ Mergens, B Keppens, K Verhaege, J Armer, CS Trinh US Patent 7,763,940, 2010 | 18 | 2010 |
| Concept for body coupling in SOI MOS transistors to improve multi-finger triggering B Keppens, G Wybo, G Vermont, B Van Camp 2006 Electrical Overstress/Electrostatic Discharge Symposium, 172-178, 2006 | 17 | 2006 |
| Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling S Trinh, M Mergens, K Verhaege, C Russ, J Armer, P Jozwiak, B Keppens, ... Microelectronics Reliability 43 (9-11), 1537-1543, 2003 | 10 | 2003 |
| ESD reliability issues in RF CMOS circuits MK Radhakrishnan, V Vassilev, B Keppens, V De Heyn, M Natarajan, ... PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 1, 557-557, 2002 | 10 | 2002 |
