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Wojciech Wiatr
Wojciech Wiatr
Warsaw University of Technology, Institute of Electronic Systems
Verified email at elka.pw.edu.pl
Title
Cited by
Cited by
Year
Noise-parameter uncertainties: A Monte Carlo simulation
J Randa
Journal of research of the National Institute of Standards and Technology …, 2002
522002
Comparison of adapter characterization methods
J Randa, W Wiatr, RL Billinger
IEEE Transactions on Microwave Theory and Techniques 47 (12), 2613-2620, 1999
411999
Coplanar-waveguide-to-microstrip transition model
W Wiatr, DK Walker, DF Williams
2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 00CH37017 …, 2000
372000
Microwave noise modeling of FinFETs
G Crupi, A Caddemi, DMMP Schreurs, W Wiatr, A Mercha
Solid-State Electronics 56 (1), 18-22, 2011
342011
A multireflect-thru method of vector network analyzer calibration
A Lewandowski, W Wiatr, D Gu, ND Orloff, J Booth
IEEE Transactions on Microwave Theory and Techniques 65 (3), 905-915, 2016
302016
Multi-frequency approach to vector-network-analyzer scattering-parameter measurements
A Lewandowski, W Wiatr, D Williams
The 40th European Microwave Conference, 260-263, 2010
252010
Systematic errors of noise parameter determination caused by imperfect source impedance measurement
W Wiatr, DK Walker
IEEE transactions on instrumentation and measurement 54 (2), 696-700, 2005
252005
Design of Microwave GaAs MESFET's for Broad-Band, Low-Noise Amplifier (Comments)
MW Pospieszalski, W Wiatr
IEEE transactions on microwave theory and techniques 34 (1), 194-194, 1986
251986
Monte Carlo estimation of noise-parameter uncertainties
J Randa, W Wiatr
IEE Proceedings-Science, Measurement and Technology 149 (6), 333-337, 2002
232002
Characterization of radiometer using eight-term linear model
W Wiatr
IEEE transactions on instrumentation and measurement 44 (2), 343-346, 1995
211995
Multiple reflect technique for wideband one-port VNA calibration
W Wiatr, A Lewandowski
2006 International Conference on Microwaves, Radar & Wireless Communications …, 2006
202006
A method for embedding network characterization with application to low-loss measurements
W Wiatr
IEEE Transactions on Instrumentation and Measurement, 487-490, 1987
201987
Accuracy and bandwidth optimization of the over-determined offset-short reflectometer calibration
A Lewandowski, W Wiatr, LJ Opalski, R Biedrzycki
IEEE Transactions on Microwave Theory and Techniques 63 (3), 1076-1089, 2015
172015
The multistate radiometer: A novel means for impedance and noise temperature measurement
W Wiatr, M Schmidt-Szalowski
IEEE transactions on instrumentation and measurement 46 (2), 486-489, 1997
151997
Characterization of microwave absorbing materials using a wideband T/R measurement technique
W Wiatr, R Frender, M Zebrowski
MIKON 2008-17th International Conference on Microwaves, Radar and Wireless …, 2008
142008
Multistate radiometry: noise de-embedding and" un-terminating"
W Wiatr
IEEE transactions on instrumentation and measurement 46 (2), 503-506, 1997
131997
Source-pull characterization of FinFET noise
W Wiatr, G Crupi, A Caddemi, A Mercha, DMMP Schreurs
Proceedings of the 17th International Conference Mixed Design of Integrated …, 2010
122010
A broadband technique for one-port VNA calibration and characterization of low-loss two-ports
W Wiatr
1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No …, 1998
111998
Complete meniscus removal method for broadband liquid characterization in a semi-open coaxial test cell
M Kalisiak, W Wiatr
Sensors 19 (9), 2092, 2019
92019
A three-step procedure utilizing only two test structures for deembedding transistor from on-wafer s-parameter measurements
M Myslinski, W Wiatr, D Schreurs
15th International Conference on Microwaves, Radar and Wireless …, 2004
92004
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