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David Litfin
David Litfin
Polar Semiconductor, LLC
Verified email at ieee.org
Title
Cited by
Cited by
Year
Mechanisms of surface anodization produced by scanning probe microscopes
AE Gordon, RT Fayfield, DD Litfin, TK Higman
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1995
2081995
System and method for dynamic ESD Protection
K Kimber, D Litfin
US Patent 6,898,061, 2005
222005
Bipolar junction transistor antifuse
KN Kimber, DD Litfin, J Burkhardt, SL Kosier
US Patent 7,071,533, 2006
112006
Silicon metal‐oxide‐semiconductor field‐effect transistor with gate structures defined by scanned probe lithography
MS Hagedorn, DD Litfin, GM Price, AE Gordon, TK Higman
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
91996
Electrostatic discharge protection circuit
DD Litfin
US Patent 6,768,176, 2004
72004
J. Vac. Sci. Technol. B
AE Gordon, RT Fayfield, DD Litfin, TK Higman
J. Vac. Sci. Technol. B 13 (6), 2805-2808, 1995
71995
Low trigger voltage electrostatic discharge protection device
D Litfin, S Kosier
US Patent App. 11/244,959, 2007
32007
High trigger current electrostatic discharge protection device
D Litfin
US Patent App. 11/287,646, 2007
22007
Anti-snapback circuitry for metal oxide semiconductor (MOS) transistor
K Kimber, D Litfin
US Patent 9,269,705, 2016
2016
Atomic Force Microscope-Based Lithography of Titanium
AE Gordon, DD Litfin, MS Hagedorn, J Chen, RT Fayfield, TK Higman
MRS Online Proceedings Library (OPL) 380, 125, 1995
1995
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