| Quantitative mechanical property mapping at the nanoscale with PeakForce QNM B Pittenger, N Erina, C Su Application Note Veeco Instruments Inc 1, 1-11, 2010 | 386 | 2010 |
| Premelting at ice-solid interfaces studied via velocity-dependent indentation with force microscope tips B Pittenger, SC Fain Jr, MJ Cochran, JMK Donev, BE Robertson, ... Physical Review B 63 (13), 134102, 2001 | 97 | 2001 |
| Mechanical property mapping at the nanoscale using PeakForce QNM scanning probe technique B Pittenger, N Erina, C Su Nanomechanical analysis of high performance materials, 31-51, 2013 | 74 | 2013 |
| Investigation of ice-solid interfaces by force microscopy: Plastic flow and adhesive forces B Pittenger, DJ Cook, CR Slaughterbeck, SC Fain Jr Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 16 (3 …, 1998 | 45 | 1998 |
| Nanoscale mechanics by tomographic contact resonance atomic force microscopy G Stan, SD Solares, B Pittenger, N Erina, C Su Nanoscale 6 (2), 962-969, 2014 | 40 | 2014 |
| Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air SC Fain Jr, KA Barry, MG Bush, B Pittenger, RN Louie Applied Physics Letters 76 (7), 930-932, 2000 | 36 | 2000 |
| Simultaneous electrical and mechanical property mapping at the nanoscale with PeakForce TUNA C Li, S Minne, B Pittenger, A Mednick, M Guide, TQ Nguyen Bruker application note AN132 Rev. A, 2011 | 32 | 2011 |
| Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment CR Slaughterbeck, EW Kukes, B Pittenger, DJ Cook, PC Williams, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996 | 32 | 1996 |
| Nanoscale DMA with the atomic force microscope: a new method for measuring viscoelastic properties of nanostructured polymer materials B Pittenger, S Osechinskiy, D Yablon, T Mueller JOM 71 (10), 3390-3398, 2019 | 30 | 2019 |
| Single molecule transcription profiling with AFM J Reed, B Mishra, B Pittenger, S Magonov, J Troke, MA Teitell, ... Nanotechnology 18 (4), 044032, 2006 | 26 | 2006 |
| Nanomechanical analysis of high performance materials B Pittenger, N Erina, C Su Solid Mech. Its Appl 203, 31-51, 2014 | 24 | 2014 |
| Preamplifying cantilevers for dynamic atomic force microscopy B Zeyen, K Virwani, B Pittenger, KL Turner Applied Physics Letters 94 (10), 2009 | 20 | 2009 |
| Performing quantitative nanomechanical AFM measurements on live cells B Pittenger, A Slade Microscopy today 21 (6), 12-17, 2013 | 19 | 2013 |
| Nanoscale quantitative mechanical property mapping using peak force tapping atomic force microscopy SC Minne, Y Hu, S Hu, B Pittenger, C Su Microscopy and Microanalysis 16 (S2), 464-465, 2010 | 16 | 2010 |
| Toward quantitative nanomechanical measurements on live cells with PeakForce QNM B Pittenger, A Slade, A Berquand, P Milani, A Boudaoud, O Hamant Bruker Application Note# 141, 2013 | 14 | 2013 |
| On the nanomechanical and viscoelastic properties of coatings made of recombinant sea star adhesive proteins M Lefevre, TQ Tran, T De Muijlder, B Pittenger, P Flammang, E Hennebert, ... Frontiers in Mechanical Engineering 7, 667491, 2021 | 11 | 2021 |
| Quantitative Mechanical Property Mapping at the Nanoscale with PeakForce QNM. Bruker Appl B Pittenger, N Erina, C Su, B Pittenger, N Erina, C Su Note128, 2008 | 10 | 2008 |
| Controlled Porosity in Ferroelectric BaTiO3 Photoanodes A Augurio, A Alvarez-Fernandez, V Panchal, B Pittenger, P De Wolf, ... ACS Applied Materials & Interfaces 14 (11), 13147-13157, 2022 | 9 | 2022 |
| Preamplifying cantilever and applications thereof B Pittenger, K Virwani, B Zeyen US Patent 7,979,916, 2011 | 9 | 2011 |
| Improving the accuracy of nanomechanical measurements with force-curve-based AFM techniques B Pittenger, DG Yablon Bruker Application Notes 1, 1-7, 2017 | 8 | 2017 |
Thomas MuellerYale University, Columbia University, BrukerVerified email at bruker.com
