Two-dimensional x-ray beam phase sensing S Bérujon, E Ziegler, R Cerbino, L Peverini Physical review letters 108 (15), 158102, 2012 | 205 | 2012 |
X-ray multimodal imaging using a random-phase object S Berujon, H Wang, K Sawhney Physical Review A—Atomic, Molecular, and Optical Physics 86 (6), 063813, 2012 | 150 | 2012 |
At-wavelength metrology of hard X-ray mirror using near field speckle S Berujon, H Wang, S Alcock, K Sawhney Optics express 22 (6), 6438-6446, 2014 | 68 | 2014 |
Single-Image Geometric-Flow X-Ray Speckle Tracking D Paganin, H Labriet, E Brun, S Berujon arXiv preprint arXiv:1808.00456, 2018 | 65 | 2018 |
X-ray wavefront characterization using a rotating shearing interferometer technique H Wang, K Sawhney, S Berujon, E Ziegler, S Rutishauser, C David Optics express 19 (17), 16550-16559, 2011 | 63 | 2011 |
X-ray multimodal tomography using speckle-vector tracking S Berujon, E Ziegler Physical Review Applied 5 (4), 044014, 2016 | 53 | 2016 |
Near-field speckle-scanning-based x-ray imaging S Berujon, E Ziegler Physical Review A 92 (1), 013837, 2015 | 48 | 2015 |
X-ray phase contrast tomography by tracking near field speckle H Wang, S Berujon, J Herzen, R Atwood, D Laundy, A Hipp, K Sawhney Scientific reports 5 (1), 8762, 2015 | 42 | 2015 |
X-ray pulse wavefront metrology using speckle tracking S Berujon, E Ziegler, P Cloetens Journal of synchrotron radiation 22 (4), 886-894, 2015 | 41 | 2015 |
Fast optimization of a bimorph mirror using x-ray grating interferometry H Wang, K Sawhney, S Berujon, J Sutter, SG Alcock, U Wagner, C Rau Optics letters 39 (8), 2518-2521, 2014 | 41 | 2014 |
Wavefront sensing at X-ray free-electron lasers M Seaberg, R Cojocaru, S Berujon, E Ziegler, A Jaggi, J Krempasky, ... Journal of synchrotron radiation 26 (4), 1115-1126, 2019 | 39 | 2019 |
X-ray optics and beam characterization using random modulation: experiments S Berujon, R Cojocaru, P Piault, R Celestre, T Roth, R Barrett, E Ziegler Journal of Synchrotron Radiation 27 (2), 293-304, 2020 | 38 | 2020 |
X-ray optics and beam characterization using random modulation: theory S Berujon, R Cojocaru, P Piault, R Celestre, T Roth, R Barrett, E Ziegler Journal of Synchrotron Radiation 27 (2), 284-292, 2020 | 36 | 2020 |
Single-shot x-ray speckle-based imaging of a single-material object KM Pavlov, H Li, DM Paganin, S Berujon, H Rougé-Labriet, E Brun Physical Review Applied 13 (5), 054023, 2020 | 35 | 2020 |
Characterisation of a novel super-polished bimorph mirror K Sawhney, S Alcock, J Sutter, S Berujon, H Wang, R Signorato Journal of Physics: Conference Series 425 (5), 052026, 2013 | 35 | 2013 |
At-wavelength metrology of x-ray optics at diamond light source K Sawhney, H Wang, J Sutter, S Alcock, S Berujon Synchrotron Radiation News 26 (5), 17-22, 2013 | 32 | 2013 |
X-ray phase microscopy using the speckle tracking technique S Berujon, H Wang, I Pape, K Sawhney Applied Physics Letters 102 (15), 2013 | 29 | 2013 |
X-ray submicrometer phase contrast imaging with a Fresnel zone plate and a two dimensional grating interferometer S Berujon, H Wang, I Pape, K Sawhney, S Rutishauser, C David Optics Letters 37 (10), 1622-1624, 2012 | 29 | 2012 |
X-ray multi-modal intrinsic-speckle-tracking KM Pavlov, DM Paganin, HT Li, S Berujon, H Rougé-Labriet, E Brun Journal of Optics 22 (12), 125604, 2020 | 27 | 2020 |
Grating-based at-wavelength metrology of hard x-ray reflective optics S Berujon, E Ziegler Optics letters 37 (21), 4464-4466, 2012 | 25 | 2012 |