| The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power MK Passarelli, A Pirkl, R Moellers, D Grinfeld, F Kollmer, R Havelund, ... Nature methods 14 (12), 1175-1183, 2017 | 387 | 2017 |
| Functional electrospun polystyrene nanofibers incorporating α-, β-, and γ-cyclodextrins: comparison of molecular filter performance T Uyar, R Havelund, J Hacaloglu, F Besenbacher, P Kingshott ACS nano 4 (9), 5121-5130, 2010 | 163 | 2010 |
| Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study AG Shard, R Havelund, MP Seah, SJ Spencer, IS Gilmore, N Winograd, ... Analytical chemistry 84 (18), 7865-7873, 2012 | 159 | 2012 |
| Molecular filters based on cyclodextrin functionalized electrospun fibers T Uyar, R Havelund, Y Nur, J Hacaloglu, F Besenbacher, P Kingshott Journal of membrane science 332 (1-2), 129-137, 2009 | 148 | 2009 |
| Thermo-Responsive Core−Sheath Electrospun Nanofibers from Poly (N-isopropylacrylamide)/Polycaprolactone Blends M Chen, M Dong, R Havelund, VR Regina, RL Meyer, F Besenbacher, ... Chemistry of Materials 22 (14), 4214-4221, 2010 | 143 | 2010 |
| Cyclodextrin functionalized poly (methyl methacrylate)(PMMA) electrospun nanofibers for organic vapors waste treatment T Uyar, R Havelund, Y Nur, A Balan, J Hacaloglu, L Toppare, ... Journal of membrane science 365 (1-2), 409-417, 2010 | 104 | 2010 |
| Argon cluster ion source evaluation on lipid standards and rat brain tissue samples C Bich, R Havelund, R Moellers, D Touboul, F Kollmer, E Niehuis, ... Analytical chemistry 85 (16), 7745-7752, 2013 | 95 | 2013 |
| The matrix effect in organic secondary ion mass spectrometry AG Shard, SJ Spencer, SA Smith, R Havelund, IS Gilmore International Journal of Mass Spectrometry 377, 599-609, 2015 | 88 | 2015 |
| Direct electrospinning of Ag/polyvinylpyrrolidone nanocables J Song, M Chen, MB Olesen, C Wang, R Havelund, Q Li, E Xie, R Yang, ... Nanoscale 3 (12), 4966-4971, 2011 | 85 | 2011 |
| 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling J Bailey, R Havelund, AG Shard, IS Gilmore, MR Alexander, JS Sharp, ... ACS applied materials & interfaces 7 (4), 2654-2659, 2015 | 74 | 2015 |
| Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study AG Shard, R Havelund, SJ Spencer, IS Gilmore, MR Alexander, ... The Journal of Physical Chemistry B 119 (33), 10784-10797, 2015 | 70 | 2015 |
| Peptide fragmentation and surface structural analysis by means of ToF-SIMS using large cluster ion sources Y Yokoyama, S Aoyagi, M Fujii, J Matsuo, JS Fletcher, NP Lockyer, ... Analytical chemistry 88 (7), 3592-3597, 2016 | 64 | 2016 |
| The formation and characterization of cyclodextrin functionalized polystyrene nanofibers produced by electrospinning T Uyar, R Havelund, J Hacaloglu, X Zhou, F Besenbacher, P Kingshott Nanotechnology 20 (12), 125605, 2009 | 60 | 2009 |
| Intracellular Drug Uptake A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS CF Newman, R Havelund, MK Passarelli, PS Marshall, I Francis, A West, ... Analytical chemistry 89 (22), 11944-11953, 2017 | 40 | 2017 |
| Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials MP Seah, R Havelund, IS Gilmore The Journal of Physical Chemistry C 118 (24), 12862-12872, 2014 | 37 | 2014 |
| Improving Secondary Ion Mass Spectrometry C60n+ Sputter Depth Profiling of Challenging Polymers with Nitric Oxide Gas Dosing R Havelund, A Licciardello, J Bailey, N Tuccitto, D Sapuppo, IS Gilmore, ... Analytical chemistry 85 (10), 5064-5070, 2013 | 26 | 2013 |
| Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size MP Seah, SJ Spencer, R Havelund, IS Gilmore, AG Shard Analyst 140 (19), 6508-6516, 2015 | 24 | 2015 |
| Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample JL Vorng, AM Kotowska, MK Passarelli, A West, PS Marshall, R Havelund, ... Analytical chemistry 88 (22), 11028-11036, 2016 | 23 | 2016 |
| Sputtering yields for mixtures of organic materials using argon gas cluster ions MP Seah, R Havelund, AG Shard, IS Gilmore The Journal of Physical Chemistry B 119 (42), 13433-13439, 2015 | 22 | 2015 |
| SIMS of delta layers in organic materials: amount of substance, secondary ion species, matrix effects, and anomalous structures in argon gas cluster depth profiles MP Seah, R Havelund, IS Gilmore The Journal of Physical Chemistry C 120 (46), 26328-26335, 2016 | 19 | 2016 |
