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Ben-Je Lwo
Ben-Je Lwo
National Defense Univ., Taiwan
Verified email at ndu.edu.tw
Title
Cited by
Cited by
Year
The effects of nitrogen partial pressure on the properties of the TaNx films deposited by reactive magnetron sputtering
TC Li, BJ Lwo, NW Pu, SP Yu, CH Kao
Surface and Coatings Technology 201 (3-4), 1031-1036, 2006
382006
In-plane packaging stress measurements through piezoresistive sensors
BJ Lwo, TS Chen, CH Kao, YL Lin
J. Electron. Packag. 124 (2), 115-121, 2002
302002
On the study of piezoresistive stress sensors for microelectronic packaging
BJ Lwo, CH Kao, TS Chen, YS Chen
J. Electron. Packag. 124 (1), 22-26, 2002
272002
Transversely varying thickness modes in trapped energy resonators with shallow and beveled contours
HF Tiersten, BJ Lwo, B Dulmet
Journal of applied physics 80 (2), 1037-1046, 1996
241996
Measurement of moisture-induced packaging stress with piezoresistive sensors
BJ Lwo, CS Lin
IEEE transactions on advanced packaging 30 (3), 393-401, 2007
222007
Calibrate piezoresistive stress sensors through the assembled structure
BJ Lwo, SY Wu
J. Electron. Packag. 125 (2), 289-293, 2003
212003
In situ stress and reliability monitoring on plastic packaging through piezoresistive stress sensor
YY Chang, H Chung, BJ Lwo, KF Tseng
IEEE Transactions on Components, Packaging and Manufacturing Technology 3 (8 …, 2013
192013
Large-area laying of soft textile power generators for the realization of body heat harvesting clothing
YS Chen, BJ Lwo
Coatings 9 (12), 831, 2019
152019
An analysis of transversely varying thickness modes in trapped energy resonators with shallow contours
HF Tiersten, BJ Lwo, B Dulmet
Proceedings of IEEE 48th Annual Symposium on Frequency Control, 172-183, 1994
151994
TSV reliability model under various stress tests
BJ Lwo, MS Lin, KH Huang
2014 IEEE 64th Electronic Components and Technology Conference (ECTC), 620-624, 2014
112014
The advanced pattern designs with electrical test methodologies on through silicon via for CMOS image sensor
H Chung, CY Ni, CM Tu, YY Chang, YT Haung, WM Chen, BY Lou, ...
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC …, 2010
112010
Global-local procedure for the heat conduction analysis of multichip modules
TL Sham, HF Tiersten, PL Baehmann, LY Song, YS Zhou, BJ Lwo, ...
Proceedings of the ASME International Electronics Packaging Conference. Part …, 1993
111993
A complete resistance extraction methodology and circuit models for typical TSV structures
H Chung, CM Tu, BJ Lwo, CY Lee
International Journal of Electronics 100 (9), 1256-1269, 2013
92013
Global-local procedure for the thermoelastic analysis of multichip modules
HF Tiersten, TL Sham, BJ Lwo, YS Shou, PL Baehmann, YL Le Coz, ...
Proceedings of the 1993 ASME international electronics packaging conference, 1993
91993
In situ chip stress extractions for LFBGA packages through piezoresistive sensors
BJ Lwo, JS Su, H Chung
72009
Calibration of piezoresistive stress sensors in electronic packaging
CY Lin, TS Chen, BJ Lwo, YS Chen, TT Ho, CY Lee, CH Kao
Proc. 6th Symp. Nano Device Technol., 173-176, 1999
71999
Calibrate MOSFET micro-stress sensors for electronic packaging
H Chung, CP Tang, YC Chao, KF Tseng, BJ Lwo
2008 10th Electronics Packaging Technology Conference, 650-656, 2008
62008
A multifunctional test chip for microelectronic packaging and its application on RF property measurements
KF Tseng, YH Hsion, BJ Lwo
International journal of electronics 94 (6), 633-643, 2007
62007
LFBGA packaging stress measurements with piezoresistive sensors
BJ Lwo, KF Tseng, CH Kao, TS Chen, JS Su
Proceedings of the 4th International Symposium on Electronic Materials and …, 2002
62002
Global/local analyses of multichip modules: Automated 3-d model construction and adaptive finite element analysis
MS Shephard, TL Sham, LY Song, VS Wong, R Garimella, HF Tiersten, ...
Proceedings of the 1993 ASME International Electronics Packaging Conference, 1993
61993
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