| Efficacy and safety of a monthly buprenorphine depot injection for opioid use disorder: a multicentre, randomised, double-blind, placebo-controlled, phase 3 trial BR Haight, SM Learned, CM Laffont, PJ Fudala, Y Zhao, AS Garofalo, ... The Lancet 393 (10173), 778-790, 2019 | 237 | 2019 |
| Changes in oxidative stress indices, zinc and copper concentrations in blood in canine demodicosis U Dimri, R Ranjan, N Kumar, MC Sharma, D Swarup, B Sharma, ... Veterinary Parasitology 154 (1-2), 98-102, 2008 | 81 | 2008 |
| Psoroptic mange infestation increases oxidative stress and decreases antioxidant status in sheep U Dimri, MC Sharma, A Yamdagni, R Ranjan, MMS Zama Veterinary parasitology 168 (3-4), 318-322, 2010 | 72 | 2010 |
| A 7nm CMOS technology platform for mobile and high performance compute application S Narasimha, B Jagannathan, A Ogino, D Jaeger, B Greene, C Sheraw, ... 2017 IEEE International Electron Devices Meeting (IEDM), 29.5. 1-29.5. 4, 2017 | 64 | 2017 |
| Effect of vitamin E and selenium supplementation on oxidative stress indices and cortisol level in blood in water buffaloes during pregnancy and early postpartum period U Dimri, R Ranjan, MC Sharma, VP Varshney Tropical Animal Health and Production 42, 405-410, 2010 | 60 | 2010 |
| Alterations in hepatic lipid peroxides and antioxidant profile in Indian water buffaloes suffering from sarcoptic mange U Dimri, MC Sharma, D Swarup, R Ranjan, M Kataria Research in veterinary science 85 (1), 101-105, 2008 | 39 | 2008 |
| Method, Apparatus, and Software System for Providing Personalized Support to Customer R Ranjan US Patent App. 11/866,127, 2009 | 36 | 2009 |
| Breakdowns in high-k gate stacks of nano-scale CMOS devices KL Pey, R Ranjan, CH Tung, LJ Tang, VL Lo, KS Lim, DS Ang Microelectronic Engineering 80, 353-361, 2005 | 36 | 2005 |
| Prevalence, clinicohaemato-biochemical alterations in colibacillosis in neonatal calves S Sekhar, R Ranjan, CV Singh, P Kumar ICAR-NRRI, 2017 | 32 | 2017 |
| Device reliability metric for end-of-life performance optimization based on circuit level assessment A Kerber, P Srinivasan, S Cimino, P Paliwoda, S Chandrashekhar, ... 2017 IEEE International Reliability Physics Symposium (IRPS), 2D-3.1-2D-3.5, 2017 | 32 | 2017 |
| A comprehensive model for breakdown mechanism in HfO/sub 2/high-k gate stacks R Ranjan, KL Pey, CH Tung, LJ Tang, G Groeseneken, LK Bera, ... IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004 | 32 | 2004 |
| Gate dielectric degradation mechanism associated with DBIE evolution KL Pey, R Ranjan, CH Tung, LJ Tang, WH Lin, MK Radhakrishnan 2004 IEEE International Reliability Physics Symposium. Proceedings, 117-121, 2004 | 27 | 2004 |
| Lsdir: A large scale dataset for image restoration Y Li, K Zhang, J Liang, J Cao, C Liu, R Gong, Y Zhang, H Tang, Y Liu, ... Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 26 | 2023 |
| Automatic recognition of machining features from a solid model using the 2D feature pattern R Ranjan, N Kumar, RK Pandey, MK Tiwari The International Journal of Advanced Manufacturing Technology 26 (7), 861-869, 2005 | 25 | 2005 |
| Effect of irrigation, calcium and boron on fruit cracking in litchi" cv. Shahi". A Kumar, C Singh, M Ral, R Ranjan | 24 | 2001 |
| Ultrafast progressive breakdown associated with metal-like filament formation of a breakdown path in a HfO2∕ TaN∕ TiN transistor R Ranjan, KL Pey, CH Tung, DS Ang, LJ Tang, T Kauerauf, R Degraeve, ... Applied physics letters 88 (12), 2006 | 23 | 2006 |
| Recognition of undercut features and parting surface of moulded parts using polyhedron face adjacency graph N Kumar, R Ranjan, MK Tiwari The International Journal of Advanced Manufacturing Technology 34 (1), 47-55, 2007 | 22 | 2007 |
| Prediction of NBTI degradation for circuit under AC operation YS Tsai, NK Jha, YH Lee, R Ranjan, W Wang, JR Shih, MJ Chen, JH Lee, ... 2010 IEEE International Reliability Physics Symposium, 665-669, 2010 | 20 | 2010 |
| Dielectric-breakdown-induced epitaxy: A universal breakdown defect in ultrathin gate dielectrics TAL Selvarajoo, R Ranjan, KL Pey, LJ Tang, CH Tung, W Lin IEEE Transactions on Device and Materials Reliability 5 (2), 190-197, 2005 | 20 | 2005 |
| Comparison of emissions and fuel consumption from CNG and gasoline fueled vehicles-effect of ignition timing S Maji, R Ranjan, PB Sharma SAE Technical Paper, 2000 | 18 | 2000 |
