Simulated annealing analysis of Rutherford backscattering data NP Barradas, C Jeynes, RP Webb Applied Physics Letters 71 (2), 291-293, 1997 | 773 | 1997 |
Elemental thin film depth profiles by ion beam analysis using simulated annealing-a new tool C Jeynes, NP Barradas, PK Marriott, G Boudreault, M Jenkin, E Wendler, ... Journal of physics D: applied physics 36 (7), R97, 2003 | 228 | 2003 |
Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study MP Seah, SJ Spencer, F Bensebaa, I Vickridge, H Danzebrink, M Krumrey, ... Surface and Interface Analysis: An International Journal devoted to the …, 2004 | 197 | 2004 |
Advanced physics and algorithms in the IBA DataFurnace NP Barradas, C Jeynes Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008 | 179 | 2008 |
“Total IBA”–Where are we? C Jeynes, MJ Bailey, NJ Bright, ME Christopher, GW Grime, BN Jones, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012 | 144 | 2012 |
Origins and effects of a surfactant excess near the surface of waterborne acrylic pressure-sensitive adhesives J Mallégol, JP Gorce, O Dupont, C Jeynes, PJ McDonald, JL Keddie Langmuir 18 (11), 4478-4487, 2002 | 123 | 2002 |
Accurate determination of quantity of material in thin films by Rutherford backscattering spectrometry C Jeynes, NP Barradas, E Szilágyi Analytical chemistry 84 (14), 6061-6069, 2012 | 122 | 2012 |
Distribution of surfactants near acrylic latex film surfaces: a comparison of conventional and reactive surfactants (surfmers) E Aramendia, J Mallégol, C Jeynes, MJ Barandiaran, JL Keddie, JM Asua Langmuir 19 (8), 3212-3221, 2003 | 121 | 2003 |
Effect of Irradiation-Induced Disorder on the Conductivity and Critical Temperature of the Organic Superconductor JG Analytis, A Ardavan, SJ Blundell, RL Owen, EF Garman, C Jeynes, ... Physical review letters 96 (17), 177002, 2006 | 109 | 2006 |
Patterned low temperature copper-rich deposits using inkjet printing GG Rozenberg, E Bresler, SP Speakman, C Jeynes, JHG Steinke Applied physics letters 81 (27), 5249-5251, 2002 | 109 | 2002 |
The thermoluminescence response of doped SiO2 optical fibres subjected to photon and electron irradiations S Hashim, S Al-Ahbabi, DA Bradley, M Webb, C Jeynes, AT Ramli, ... Applied Radiation and Isotopes 67 (3), 423-427, 2009 | 107 | 2009 |
The new Surrey ion beam analysis facility A Simon, C Jeynes, RP Webb, R Finnis, Z Tabatabaian, PJ Sellin, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 107 | 2004 |
International Atomic Energy Agency intercomparison of ion beam analysis software NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007 | 106 | 2007 |
Thin film depth profiling by ion beam analysis C Jeynes, JL Colaux Analyst 141 (21), 5944-5985, 2016 | 104 | 2016 |
Reduction of bacterial adhesion on ion-implanted stainless steel surfaces Q Zhao, Y Liu, C Wang, S Wang, N Peng, C Jeynes Medical engineering & physics 30 (3), 341-349, 2008 | 86 | 2008 |
Summary of “IAEA intercomparison of IBA software” NP Barradas, K Arstila, G Battistig, M Bianconi, N Dytlewski, C Jeynes, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008 | 83 | 2008 |
Accurate RBS measurements of the indium content of InGaAs thin films C Jeynes, ZH Jafri, RP Webb, AC Kimber, MJ Ashwin Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 78 | 1997 |
Amorphous-iron disilicide: A promising semiconductor M Milosavljević, G Shao, N Bibić, CN McKinty, C Jeynes, KP Homewood Applied Physics Letters 79 (10), 1438-1440, 2001 | 66 | 2001 |
Unambiguous automatic evaluation of multiple ion beam analysis data with simulated annealing NP Barradas, C Jeynes, RP Webb, U Kreissig, R Grötzschel Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1999 | 66 | 1999 |
Influence of interfaces on the rates of crosslinking in poly (dimethyl siloxane) coatings TRE Simpson, Z Tabatabaian, C Jeynes, B Parbhoo, JL Keddie Journal of Polymer Science Part A: Polymer Chemistry 42 (6), 1421-1431, 2004 | 64 | 2004 |