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Daniel Holcomb
Daniel Holcomb
Associate Professor, University of Massachusetts
Verified email at engin.umass.edu - Homepage
Title
Cited by
Cited by
Year
Power-up SRAM state as an identifying fingerprint and source of true random numbers
DE Holcomb, WP Burleson, K Fu
IEEE Transactions on Computers 58 (9), 1198-1210, 2008
8932008
Initial SRAM state as a fingerprint and source of true random numbers for RFID tags
DE Holcomb, WP Burleson, K Fu
Proceedings of the Conference on RFID Security 7 (2), 01, 2007
4382007
PUFs at a glance
U Rührmair, DE Holcomb
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
1442014
FPGA Side Channel Attacks without Physical Access
C Ramesh, SB Patil, SN Dhanuskodi, G Provelengios, S Pillement, ...
Field-Programmable Custom Computing Machines (FCCM), 2018 IEEE 26th Annual …, 2018
1072018
Low-power sub-threshold design of secure physical unclonable functions
L Lin, D Holcomb, DK Krishnappa, P Shabadi, W Burleson
Proceedings of the 16th ACM/IEEE international symposium on Low power …, 2010
942010
Physical Design Obfuscation of Hardware: A Comprehensive Investigation of Device-and Logic-Level Techniques
A Vijayakumar, VC Patil, DE Holcomb, C Paar, S Kundu
IEEE Transactions on Information Forensics and Security, 2016
912016
TARDIS: Time and Remanence Decay in SRAM to Implement Secure Protocols on Embedded Devices without Clocks.
A Rahmati, M Salajegheh, DE Holcomb, J Sorber, WP Burleson, K Fu
USENIX Security Symposium, 221-236, 2012
772012
Incremental SAT-based reverse engineering of camouflaged logic circuits
C Yu, X Zhang, D Liu, M Ciesielski, D Holcomb
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
712017
Design as you see FIT: System-level soft error analysis of sequential circuits
D Holcomb, W Li, SA Seshia
2009 Design, Automation & Test in Europe Conference & Exhibition, 785-790, 2009
712009
Persistent Clocks for Batteryless Sensing Devices
J HESTER, N TOBIAS, A RAHMATI, L SITANAYAH, D HOLCOMB, K FU, ...
ACM Transactions on Embedded Computing Systems (TECS) 15 (4), 77:1--77:28, 2016
672016
Trajectory model validation using newly developed altitude‐controlled balloons during the International Consortium for Atmospheric Research on Transport and Transformations …
EE Riddle, PB Voss, A Stohl, D Holcomb, D Maczka, K Washburn, ...
Journal of Geophysical Research: Atmospheres 111 (D23), 2006
562006
Bitline PUF: building native challenge-response PUF capability into any SRAM
DE Holcomb, K Fu
International Workshop on Cryptographic Hardware and Embedded Systems, 510-526, 2014
552014
Oracle-Guided Incremental SAT Solving to Reverse Engineer Camouflaged Logic Circuits
D Liu, C Yu, X Zhang, D Holcomb
Proceedings of Design Automation and Test in Europe (DATE '16), 433-438, 2016
542016
Security Evaluation and Enhancement of Bistable Ring PUFs
X Xu, U Rührmair, DE Holcomb, W Burleson
International Workshop on Radio Frequency Identification: Security and …, 2015
542015
Reliable physical unclonable functions using data retention voltage of SRAM cells
X Xu, A Rahmati, DE Holcomb, K Fu, W Burleson
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
462015
Nanoscale diffusive memristor crossbars as physical unclonable functions
R Zhang, H Jiang, ZR Wang, P Lin, Y Zhuo, D Holcomb, DH Zhang, ...
Nanoscale 10 (6), 2721-2726, 2018
432018
A Design Methodology for Stealthy Parametric Trojans and Its Application to Bug Attacks
S Ghandali, GT Becker, D Holcomb, C Paar
Cryptographic Hardware and Embedded Systems–CHES 2016, 2016
432016
DRV-Fingerprinting: using data retention voltage of SRAM cells for chip identification
DE Holcomb, A Rahmati, M Salajegheh, WP Burleson, K Fu
International Workshop on Radio Frequency Identification: Security and …, 2012
412012
Characterizing Power Distribution Attacks in Multi-User FPGA Environments
G Provelengios, D Holcomb, R Tessier
2019 29th International Conference on Field Programmable Logic and …, 2019
402019
Efficient PUF-Based Key Generation in FPGAs Using Per-Device Configuration
MA Usmani, S Keshavarz, E Matthews, L Shannon, R Tessier, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (2), 364-375, 2018
402018
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