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Co-authors
- In-Cheol ParkProfessor of Electrical Engineering, KAISTVerified email at kaist.edu
- Youngjoo LeeAssociate Professor, Pohang University of Science and Technology (POSTECH)Verified email at postech.ac.kr
- Hoyoung YooAssistant professor, Chungnam National UniversityVerified email at cnu.ac.kr
- Dongyun KamPOSTECHVerified email at postech.ac.kr
- Jihyuck JoKorea Advanced Institute of Science and TechnologyVerified email at kaist.ac.kr
- Bongjin KimSamsung ElectronicsVerified email at samsung.com
- Sangbu YunPOSTECH E.E.Verified email at postech.ac.kr
- Suchang KimKorea Advanced Institute of Science and Technology (KAIST)Verified email at ics.kaist.ac.kr
- Jaewoong ChoiSchool of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST)Verified email at ics.kaist.ac.kr
- Jooseung LeeKorea Electrotechnology Research Institute (KERI)Verified email at keri.re.kr
- Jaehwan JungElectrical Engineering, KAISTVerified email at kaist.ac.kr
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Byeong Yong Kong
Associate Professor, Kongju National University
Verified email at kongju.ac.kr - Homepage