| Continuing degradation of the SiO2/Si interface after hot hole stress IS Al-Kofahi, JF Zhang, G Groeseneken Journal of applied physics 81 (6), 2686-2692, 1997 | 44 | 1997 |
| Behavior of hot hole stressed SiO/Si interface at elevated temperature JF Zhang, IS Al-Kofahi, G Groeseneken Journal of applied physics 83 (2), 843-850, 1998 | 40 | 1998 |
| Fabrication, performance and parasitic parameter extraction of 850 nm high-speed vertical-cavity lasers AN Al-Omari, IK Al-Kofahi, KL Lear Semiconductor Science and Technology 24 (9), 095024, 2009 | 37 | 2009 |
| Genetic algorithm-based performance analysis of self-excited induction generator YN Anagreh, IS Al-Kofahi International Journal of Modelling and Simulation 26 (2), 175-179, 2006 | 19 | 2006 |
| Optical characterization of sputtered aluminum nitride thin films–correlating refractive index with degree of c-axis orientation A Ababneh, Z Albataineh, AMK Dagamseh, IS Al-Kofahi, B Schäfer, ... Thin Solid Films 693, 137701, 2020 | 13 | 2020 |
| Design of Power-Line Communication System (PLC) Using a PIC Microcontroller. Q Al-Zobi, I Al-Tawil, K Gharaibeh, IS Al-Kofahi Journal of Active & Passive Electronic Devices 3, 2008 | 12 | 2008 |
| A two-stage power amplifier design for ultra-wideband applications IS Al-Kofahi, Z Albataineh, A Dagamseh Int. J. Electr. Comput. Eng.(IJECE) 11, 772-779, 2021 | 7 | 2021 |
| Theoretical and experimental investigation of fiber loss and dispersion effects in optical networks SM Abu–Gazleh, AA Eyadeh, IS Al-kofahi, QA Quran Journal of Electron Devices 18, 1524-1530, 2013 | 5 | 2013 |
| A High-Gain Low Noise Amplifier for RFID Front-Ends Reader MA 3. Zaid Al bataineha, Yazan Hamadeh, Jafar Moheidat, Ahmad Dagamseh ... Jordan Journal of Electrical Engineering 3 (1), 65-74, 2017 | 4* | 2017 |
| Accurate and direct determination of interdiffusion parameters, a genetic algorithm approach OM Khreis, IS Al-Kofahi Semiconductor science and technology 20 (3), 320, 2005 | 4 | 2005 |
| On the hot hole induced post-stress interface trap generation in MOSFET's IS Al-Kofahi, JF Zhang, G Groeseneken Proceedings of International Reliability Physics Symposium, 305-310, 1996 | 4 | 1996 |
| Generation and annealing of hot hole induced interface states IS Al-Kofahi, JF Zhang, G Groeseneken Microelectronic engineering 36 (1-4), 227-230, 1997 | 3 | 1997 |
| Minimization of Bending loss in Materials for Integrated Optics. M Omari, A Ijjeh, IS Al-Kofahi Journal of Active & Passive Electronic Devices 3, 2008 | 2 | 2008 |
| A genetic algorithm analysis of photoluminescence experimental data from interdiffused quantum wells OM Khreis, IS Al-Kofahi Superlattices and Microstructures 37 (3), 193-201, 2005 | 1 | 2005 |
| The effect of hot electron current density on nMOSFET reliability O Buiu, S Taylor, IS Al-Kofahi, C Beech Microelectronics Reliability 38 (6-8), 1085-1089, 1998 | 1 | 1998 |
| The hot carrier induced degradation of Si/SiO↠2 interface. ISA Al-Kofahi Liverpool John Moores University, 1997 | 1 | 1997 |
| The narrowband tunable Radio Frequency (RF) power amplifier with High-Efficiency at 2.4 GHz Frequency MTAD Idrees S. Al-Kofahi, Zaid Albataineh International Journal of Emerging Trends in Engineering Research 8 (3), 763-768, 2020 | | 2020 |
| INVESTIGATING CURRENT DENSITY DEPENDENCE OF OXIDE TRAP CHARGING IN n-MOSFETS DURING SUBSTRATE ELECTRONS INJECTION: A GENETIC ALGORITHM APPROACH IS AL-Kofahi Journal of Electron Devices 17, 1433-1438, 2013 | | 2013 |
| On the subthreshold measurements of SIC MOSFETs IS Al-Kofahi 2008 IEEE International Conference on Semiconductor Electronics, 458-461, 2008 | | 2008 |
| Theoretical Analysis of a Non-homogeneous in Non-identical Optical Directional Coupler with Electrical Control. A Ijjeh, M Omari, AN Al-Omari, IS Al-Kofahi Journal of Active & Passive Electronic Devices 3, 2008 | | 2008 |
