Mahmoud S. Rasras
Mahmoud S. Rasras
NYU Abu Dhabi
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Impact of MOSFET gate oxide breakdown on digital circuit operation and reliability
B Kaczer, R Degraeve, M Rasras, K Van de Mieroop, PJ Roussel, ...
IEEE Transactions on Electron Devices 49 (3), 500-506, 2002
Monolithic polarization and phase diversity coherent receiver in silicon
CR Doerr, PJ Winzer, YK Chen, S Chandrasekhar, MS Rasras, L Chen, ...
Journal of lightwave technology 28 (4), 520-525, 2010
Electronic-photonic integrated circuits on the CMOS platform
LC Kimerling, D Ahn, AB Apsel, M Beals, D Carothers, YK Chen, ...
Silicon photonics 6125, 6-15, 2006
Demonstration of a tunable microwave-photonic notch filter using low-loss silicon ring resonators
MS Rasras, KY Tu, DM Gill, YK Chen, AE White, SS Patel, A Pomerene, ...
Journal of lightwave technology 27 (12), 2105-2110, 2009
Integrated resonance-enhanced variable optical delay lines
MS Rasras, CK Madsen, MA Cappuzzo, E Chen, LT Gomez, ...
IEEE photonics technology letters 17 (4), 834-836, 2005
Demonstration of a fourth-order pole-zero optical filter integrated using CMOS processes
MS Rasras, DM Gill, SS Patel, KY Tu, YK Chen, AE White, ATS Pomerene, ...
Journal of Lightwave Technology 25 (1), 87-92, 2007
Impact of MOSFET oxide breakdown on digital circuit operation and reliability
B Kaczer, R Degraeve, G Groeseneken, M Rasras, S Kubicek, ...
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No …, 2000
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
C Russ, K Bock, M Rasras, ID Wolf, G Groeseneken, HE Maes
Microelectronics Reliability 39 (11), 1551-1561, 1999
Process flow innovations for photonic device integration in CMOS
M Beals, J Michel, JF Liu, DH Ahn, D Sparacin, R Sun, CY Hong, ...
Silicon Photonics III 6898, 31-44, 2008
Monolithic multi degree of freedom (MDoF) capacitive MEMS accelerometers
Z Mohammed, IAM Elfadel, M Rasras
Micromachines 9 (11), 602, 2018
All-optical XOR and XNOR operations at 86.4 Gb/s using a pair of semiconductor optical amplifier Mach-Zehnder interferometers
I Kang, M Rasras, L Buhl, M Dinu, S Cabot, M Cappuzzo, LT Gomez, ...
Optics express 17 (21), 19062-19066, 2009
Regenerative all optical wavelength conversion of 40-Gb/s DPSK signals using a semiconductor optical amplifier Mach-Zehnder interferometer
I Kang, C Dorrer, L Zhang, M Rasras, L Buhl, A Bhardwaj, S Cabot, ...
2005 31st European Conference on Optical Communication, ECOC 2005 6, 29-30, 2005
Silicon RF-photonic filter and down-converter
KY Tu, MS Rasras, DM Gill, SS Patel, YK Chen, AE White, A Pomerene, ...
Journal of Lightwave Technology 28 (20), 3019-3028, 2010
Mechanically robust amino acid crystals as fiber-optic transducers and wide bandpass filters for optical communication in the near-infrared
DP Karothu, G Dushaq, E Ahmed, L Catalano, S Polavaram, R Ferreira, ...
Nature communications 12 (1), 1326, 2021
CMOS-compatible Si-ring-assisted Mach–Zehnder interferometer with internal bandwidth equalization
DM Gill, SS Patel, M Rasras, KY Tu, AE White, YK Chen, A Pomerene, ...
IEEE Journal of Selected Topics in Quantum Electronics 16 (1), 45-52, 2009
Perception, performance, and detectability of conversational artificial intelligence across 32 university courses
H Ibrahim, F Liu, R Asim, B Battu, S Benabderrahmane, B Alhafni, ...
Scientific Reports 13 (1), 12187, 2023
Plasmonic Schottky photodetector with metal stripe embedded into semiconductor and with a CMOS-compatible titanium nitride
J Gosciniak, A Fatih B, C Brian, M Rasras
Scientific Reports (Nature Publisher Group) 9 (1), 2019
Silicon hybrid (de) multiplexer enabling simultaneous mode and wavelength-division multiplexing
T Mulugeta, M Rasras
Optics Express 23 (2), 943-949, 2015
Characterization of the dynamical processes in all-optical signal processing using semiconductor optical amplifiers
I Kang, C Dorrer, L Zhang, M Dinu, M Rasras, LL Buhl, S Cabot, ...
IEEE Journal of Selected Topics in Quantum Electronics 14 (3), 758-769, 2008
Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
B Kaczer, R Degraeve, M Rasras, A De Keersgieter, K Van de Mieroop, ...
Microelectronics Reliability 42 (4-5), 555-564, 2002
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