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Co-authors
- Ivan SeskarChief Technologist & Director, IT, WINLAB, Departmant of ECE, Rutgers UniversityVerified email at winlab.rutgers.edu
- David GoodmanProfessor Emeritus, New York UniversityVerified email at nyu.edu
- Walid SaadProfessor, Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
- Cem U. SaraydarGeneral MotorsVerified email at gm.com
- Ryoichi ShinkumaShibaura Institute of TechnologyVerified email at shibaura-it.ac.jp
- Wenjia YuanECE, Rutgers UniversityVerified email at eden.rutgers.edu
- Cristina ComaniciuStevens Institute of TechnologyVerified email at stevens.edu
- Takayuki NishioSchool of Engineering, Tokyo TechVerified email at ict.e.titech.ac.jp
- Sastry KompellaU.S. Naval Research LaboratoryVerified email at vt.edu
- Dipankar RaychaudhuriProfessor ECE & Director, WINLAB, Rutgers UniversityVerified email at winlab.rutgers.edu
- Dan ZhangRutgers UniversityVerified email at winlab.rutgers.edu
- Mohammad HajimirsadeghiData Science Manager, Engage3Verified email at engage3.com
- Zoran GajicProfessor of Electrical and Computer Engineering, Rutgers UniversityVerified email at ece.rutgers.edu
- Aidin FerdowsiPrincipal Associate Machine Learning Engineer, Capital OneVerified email at vt.edu
- Ratnesh KumbhkarResearch Engineer, Intel CorporationVerified email at winlab.rutgers.edu
- Muhammad Nazmul IslamQualcommVerified email at qti.qualcomm.com
- JIGNESH PANCHALVerizonVerified email at one.verizon.com
- Narayanan KrishnanQualcomm Technologies Inc.Verified email at winlab.rutgers.edu
- Anand SarwateAssociate Professor, Rutgers UniversityVerified email at rutgers.edu
- Gokul SridharanQualcomm IncVerified email at winlab.rutgers.edu