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Hans G. Kerkhoff
Hans G. Kerkhoff
Verified email at utwente.nl
Title
Cited by
Cited by
Year
Testing microelectronic biofluidic systems
HG Kerkhoff
IEEE Design & Test of Computers 24 (1), 72-82, 2007
722007
Multiple-valued logic charge-coupled devices
HG Kerkhoff, ML Tervoert
IEEE Transactions on computers 30 (09), 644-652, 1981
631981
Testability analysis of analog systems
GJ Hemink, BW Meijer, HG Kerkhoff
IEEE transactions on computer-aided design of integrated circuits and …, 1990
621990
Testable design and testing of micro-electro-fluidic arrays
HG Kerkhoff, M Acar
Proceedings. 21st VLSI Test Symposium, 2003., 403-409, 2003
552003
Current-mode CMOS high-radix circuits
SP Onnewee
Proc, 16th Int. Symp, on Multiple-Valued Logic, 1986, 60-69, 1986
541986
Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems
HG Kerkhoff, H Hendriks
Journal of electronic testing 17 (5), 427-437, 2001
462001
Structural computer-aided design of current-mode CMOS logic circuits
S Onneweer, H Kerkhoff, J Butler
NAVAL POSTGRADUATE SCHOOL MONTEREY CA DEPT OF ELECTRICAL AND COMPUTER …, 1988
361988
Multiple-valued CCD circuits
JT Butler, HG Kerkhoff
Computer 21 (4), 58-69, 1988
351988
Synchronous full-scan for asynchronous handshake circuits
F Te Beest, A Peeters, K Van Berkel, H Kerkhoff
Journal of Electronic Testing 19 (4), 397-406, 2003
342003
Automatic scan insertion and test generation for asynchronous circuits
FT Beest, A Peeters, M Verra, K van Berkel, H Kerkhoff
Proceedings. International Test Conference, 804-813, 2002
322002
Design and implementation of a hierarchical testable architecture using the boundary scan standard
RP Van Riessen, HG Kerkhoff, A Kloppenburg
Proceedings of the 1st European Test Conference, 112,113,114,115,116,117,118 …, 1989
321989
Tackling test trade-offs from design, manufacturing to market using economic modeling
EH Volkerink, A Khoche, LA Kamas, J Rivoir, HG Kerkhoff
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 1098-1107, 2001
312001
High-radix current-mode CMOS circuits based on the truncated-difference operator
SP Onneweer, HG Kerkhoff
Proc. 17th ISMVL, 188-195, 1987
311987
Exploiting multiple mahalanobis distance metrics to screen outliers from analog product manufacturing test responses
S Krishnan, HG Kerkhoff
IEEE Design & Test 30 (3), 18-24, 2013
282013
Design of a high-radix programmable logic array using profiled peristaltic charge-coupled devices
HG Kerkhoff, JT Butler
Proc. 16th Int. Symp. Multiple-Valued Logic, 128-136, 1986
281986
Integration of the scan-test method into an architecture specific core-test approach
C Feige, JT Pierick, C Wouters, R Tangelder, HG Kerkhoff
Journal of electronic testing 14 (1), 125-131, 1999
261999
Testing philosophy behind the micro analysis system
HG Kerkhoff
Design, Test, and Microfabrication of MEMS and MOEMS 3680, 78-83, 1999
241999
Design of an infrastructural IP dependability manager for a dependable reconfigurable many-core processor
HG Kerkhoff, X Zhang
2010 Fifth IEEE International Symposium on Electronic Design, Test …, 2010
232010
TASTE: A tool for analog system testability evaluation
GJ Hemink, BW Meijer, HG Kerkhoff
International Test Conference 1988 Proceeding@ m_New Frontiers in Testing …, 1988
221988
Analysis and design of an on-chip retargeting engine for IEEE 1687 networks
A Ibrahim, HG Kerkhoff
2016 21th IEEE European Test Symposium (ETS), 1-6, 2016
212016
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