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Svetlana Lyatun (Medvedeva)
Svetlana Lyatun (Medvedeva)
Immanuel Kant Baltic Federal University
Verified email at innopark.kantiana.ru
Title
Cited by
Cited by
Year
X-ray reflecto-interferometer based on compound refractive lenses
S Lyatun, D Zverev, P Ershov, I Lyatun, O Konovalov, I Snigireva, ...
Journal of synchrotron radiation 26 (5), 1572-1581, 2019
132019
Effect of annealing on structural and optical properties of Cu2ZnSnS4 thin films grown by pulsed laser deposition
GD Surgina, VN Nevolin, IP Sipaylo, PE Teterin, SS Medvedeva, ...
Thin Solid Films 594, 74-79, 2015
132015
Martensitic transformation behavior of Ni2. 44Mn0. 48Ga1. 08 thin glass-coated microwire
S Shevyrtalov, A Zhukov, I Lyatun, S Medvedeva, H Miki, V Zhukova, ...
Journal of Alloys and Compounds 745, 217-221, 2018
52018
Features of the phase formation in Ni-Mn-In Heusler alloy thin films
AI Grunin, AY Goikhman, VV Rodionova, SS Medvedeva
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2015
42015
Radial elemental and phase separation in Ni-Mn-Ga glass-coated microwires
S Shevyrtalov, A Zhukov, S Medvedeva, I Lyatun, V Zhukova, ...
Journal of Applied Physics 123 (17), 2018
32018
Optical and structural properties of Cu2ZnSnS4 thin films obtained by pulsed laser deposition in a H2S atmosphere with subsequent annealing in a N2 atmosphere
GD Teterina, VN Nevolin, IP Sipaylo, SS Medvedeva, PE Teterin
Semiconductors 50, 549-554, 2016
32016
Porous membranes on a basis of phase-separated alkali borosilicate glasses that contain PbO and F additives
T Antropova, L Ermakova, S Medvedeva, M Sidorova
GLASS SCIENCE AND TECHNOLOGY 77, 193-198, 2004
32004
X-ray reflecto-interferometer based on compound refractive lenses for thin-films study
M Voevodina, S Lyatun, A Barannikov, I Lyatun, D Zverev, I Snigireva, ...
AIP Conference Proceedings 2299 (1), 2020
12020
X-ray interferometry technique using an x-ray microfocus laboratory source
M Voevodina, S Lyatun, A Barannikov, I Lyatun, I Snigireva, A Snigirev
Advances in Metrology for X-Ray and EUV Optics IX 11492, 92-97, 2020
12020
Martensitic transformation in Cu-doped Ni–Fe-Ga rapidly quenched ribbon
S Shevyrtalov, I Lyatun, A Grunin, T Ryba, S Lyatun, K Chichay, ...
Physica B: Condensed Matter 583, 412048, 2020
12020
Исследование изменения параметров тонкопленочных структур в процессе ионной имплантации
ЧПН Медведева С. С., Коива Д. А., Шемухин А. А.
Вестник Балтийского федерального университета им. И. Канта. Серия: ФИЗИКО …, 2014
12014
Unusual Role of N-Methylmorpholine N-Oxide in the Radical Polymerization of Acrylonitrile
RV Toms, SS Medvedeva, AY Gerval’d, NI Prokopov, AV Plutalova, ...
Polymer Science, Series B 64 (5), 623-635, 2022
2022
Thin layer imaging approach by X-ray amplitude splitting interferometer based on compound refractive lens
D Zverev, M Voevodina, S Lyatun, I Snigireva, A Snigirev
EUV and X-ray Optics, Sources, and Instrumentation 11776, 43-49, 2021
2021
X-ray interferometry technique for thin-films study using an x-ray microfocus laboratory source
M Voevodina, S Lyatun, D Zverev, A Barannikov, I Lyatun, I Snigireva, ...
EUV and X-ray Optics, Sources, and Instrumentation 11776, 37-42, 2021
2021
X-ray Reflecto-Interferometry Technique Using a Microfocus Laboratory Source
MA Voevodina, SS Lyatun, AA Barannikov, II Lyatun, II Snigireva, ...
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques …, 2021
2021
The influence of beryllium microstructure and impurities on the CRL x-ray optical properties
I Lyatun, S Lyatun, I Snigireva, A Snigirev
AIP Conference Proceedings 2299 (1), 2020
2020
Refractive optics based x-ray reflecto-interferometry
S Lyatun, I Lyatun, D Zverev, O Konovalov, I Snigireva, A Snigirev
Advances in X-Ray/EUV Optics and Components XV 11491, 57-65, 2020
2020
X-ray thin-film interferometry technique using an X-ray microfocus laboratory source
M Voevodina, S Lyatun, D Zverev, A Barannikov, I Lyatun, O Konovalov, ...
2019
On the use of a ZrO x -SiO2 multilayer structure as a test sample for high-resolution X-ray microscopy
SS Medvedeva, II Lyatun, PA Ershov, AY Goikhman, II Snigireva, ...
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques …, 2015
2015
МНОГОСЛОЙНАЯ СТРУКТУРА ТИПА ZrOx/SiO2 КАК ТЕСТОВЫЙ ОБЪЕКТ ДЛЯ ВЫСОКОРАЗРЕШАЮЩЕЙ РЕНТГЕНОВСКОЙ МИКРОСКОПИИ
СС Медведева, ИИ Лятун, ПА Ершов, АЮ Гойхман, ИИ Снигирева, ...
Поверхность. Рентгеновские, синхротронные и нейтронные исследования, 29-29, 2015
2015
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