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Brady Benware
Brady Benware
Mentor, A Siemens Business
Verified email at mentor.com
Title
Cited by
Cited by
Year
Demonstration of a high average power tabletop soft X-ray laser
BR Benware, CD Macchietto, CH Moreno, JJ Rocca
Physical Review Letters 81 (26), 5804, 1998
4321998
Generation of millijoule-level soft-x-ray laser pulses at a 4-Hz repetition rate in a highly saturated tabletop capillary discharge amplifier
CD Macchietto, BR Benware, JJ Rocca
Optics letters 24 (16), 1115-1117, 1999
3481999
Impact of multiple-detect test patterns on product quality
B Benware, C Schuermyer, S Ranganathan, R Madge, P Krishnamurthy, ...
International Test Conference, 2003. Proceedings. ITC 2003., 1031-1031, 2003
2112003
Focusing of a tabletop soft-x-ray laser beam and laser ablation
BR Benware, A Ozols, JJ Rocca, IA Artioukov, VV Kondratenko, ...
Optics letters 24 (23), 1714-1716, 1999
1081999
Analyzing volume diagnosis results with statistical learning for yield improvement
H Tang, S Manish, J Rajski, M Keim, B Benware
12th IEEE European Test Symposium (ETS'07), 145-150, 2007
1052007
Operation and output pulse characteristics of an extremely compact capillary-discharge tabletop soft-x-ray laser
BR Benware, CH Moreno, DJ Burd, JJ Rocca
Optics letters 22 (11), 796-798, 1997
1011997
Two-dimensional near-field and far-field imaging of a Ne-like Ar capillary discharge table-top soft-x-ray laser
CH Moreno, MC Marconi, VN Shlyaptsev, BR Benware, CD Macchietto, ...
Physical Review A 58 (2), 1509, 1998
981998
Measurement of the spatial coherence buildup in a discharge pumped table-top soft x-ray laser
MC Marconi, JLA Chilla, CH Moreno, BR Benware, JJ Rocca
Physical review letters 79 (15), 2799, 1997
971997
A rapid yield learning flow based on production integrated layout-aware diagnosis
M Keim, N Tamarapalli, H Tang, M Sharma, J Rajski, C Schuermyer, ...
2006 IEEE International Test Conference, 1-10, 2006
952006
In search of the optimum test set-adaptive test methods for maximum defect coverage and lowest test cost
R Madge, B Benware, R Turakhia, R Daasch, C Schuermyer, J Ruffler
2004 International Conferce on Test, 203-212, 2004
722004
Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs
BR Benware, R Madge, C Lu, R Daasch
Proceedings. 21st VLSI Test Symposium, 2003., 39-46, 2003
722003
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results
B Benware, M Sharma, C Schuermyer, T Herrmann
Design & Test of Computers, IEEE, 1-1, 2012
672012
Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser
IA Artioukov, BR Benware, JJ Rocca, M Forsythe, YA Uspenskii, ...
IEEE Journal of Selected Topics in Quantum Electronics 5 (6), 1495-1501, 1999
571999
Obtaining high defect coverage for frequency-dependent defects in complex ASICs
R Madge, BR Benware, WR Daasch
IEEE Design & Test of Computers 20 (5), 46-53, 2003
522003
Efficiently performing yield enhancements by identifying dominant physical root cause from test fail data
M Sharma, B Benware, L Ling, D Abercrombie, L Lee, M Keim, H Tang, ...
2008 IEEE International Test Conference, 1-9, 2008
502008
Enhancing transition fault model for delay defect diagnosis
WT Cheng, B Benware, R Guo, KH Tsai, T Kobayashi, K Maruo, M Nakao, ...
2008 17th Asian Test Symposium, 179-184, 2008
492008
Experiences with layout-aware diagnosis–a case study
YJ Chang, MT Pang, M Brennan, A Man, M Keim, G Eide, B Benware, ...
Electronic Device Failure Analysis 12 (12), 12-18, 2010
432010
Improved volume diagnosis throughput using dynamic design partitioning
X Fan, H Tang, Y Huang, WT Cheng, SM Reddy, B Benware
2012 IEEE International Test Conference, 1-10, 2012
412012
Affordable and effective screening of delay defects in ASICs using the inline resistance fault model
B Benware, C Lu, J Van Slyke, P Krishnamurthy, R Madge, M Keim, ...
2004 International Conferce on Test, 1285-1294, 2004
392004
Defect screening using independent component analysis on I/sub DDQ
R Turakhia, B Benware, R Madge, T Shannon, R Daasch
23rd IEEE VLSI Test Symposium (VTS'05), 427-432, 2005
342005
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