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Xavier Rottenberg
Xavier Rottenberg
Group Leader and Principal Scientist at IMEC
Verified email at imec.be
Title
Cited by
Cited by
Year
Cloning of continuous quantum variables
NJ Cerf, A Ipe, X Rottenberg
Physical review letters 85 (8), 1754-1757, 2000
2872000
Low-loss singlemode PECVD silicon nitride photonic wire waveguides for 532–900 nm wavelength window fabricated within a CMOS pilot line
AZ Subramanian, P Neutens, A Dhakal, R Jansen, T Claes, X Rottenberg, ...
IEEE Photonics Journal 5 (6), 2202809-2202809, 2013
2432013
Expanding the silicon photonics portfolio with silicon nitride photonic integrated circuits
A Rahim, E Ryckeboer, AZ Subramanian, S Clemmen, B Kuyken, ...
Journal of lightwave technology 35 (4), 639-649, 2017
2272017
Analytical model of the DC actuation of electrostatic MEMS devices with distributed dielectric charging and nonplanar electrodes
X Rottenberg, I De Wolf, BKJC Nauwelaers, W De Raedt, HAC Tilmans
Journal of Microelectromechanical Systems 16 (5), 1243-1253, 2007
1602007
Distributed dielectric charging and its impact on RF MEMS devices
X Rottenberg, B Nauwelaers, W De Raedt, HAC Tilmans
34th European Microwave Conference, 2004. 1, 77-80, 2004
1092004
Wafer-level packaged RF-MEMS switches fabricated in a CMOS fab
HAC Tilmans, H Ziad, H Jansen, O Di Monaco, A Jourdain, W De Raedt, ...
International Electron Devices Meeting. Technical Digest (Cat. No. 01CH37224 …, 2001
1022001
Tunable stop-band filter at Q-band based on RF-MEMS metamaterials
I Gil, F Martın, X Rottenberg, W De Raedt
Electronics Letters 43 (21), 1153-1154, 2007
922007
Evaluation of platinum as a structural thin film material for RF-MEMS devices
P Ekkels, X Rottenberg, R Puers, HAC Tilmans
Journal of Micromechanics and Microengineering 19 (6), 065010, 2009
662009
Sensitive, small, broadband and scalable optomechanical ultrasound sensor in silicon photonics
WJ Westerveld, M Mahmud-Ul-Hasan, R Shnaiderman, V Ntziachristos, ...
Nature Photonics 15 (5), 341-345, 2021
552021
Switchable capacitor and method of making the same
X Rottenberg, H Jansen, H Tilmans, W De Raedt
US Patent 7,002,439, 2006
542006
Optimization of 0-level packaging for RF-MEMS devices
A Jourdain, X Rottenberg, G Carchon, HAC Tilmans
TRANSDUCERS'03. 12th International Conference on Solid-State Sensors …, 2003
512003
Novel RF-MEMS capacitive switching structures
X Rottenberg, H Jansen, P Fiorini, W De Raedt, HAC Tilmans
2002 32nd European Microwave Conference, 1-4, 2002
482002
Effect of substrate charging on the reliability of capacitive RF MEMS switches
P Czarnecki, X Rottenberg, P Soussan, P Ekkels, P Muller, P Nolmans, ...
Sensors and Actuators A: Physical 154 (2), 261-268, 2009
432009
An electrostatic fringing-field actuator (EFFA): application towards a low-complexity thin-film RF-MEMS technology
X Rottenberg, S Brebels, P Ekkels, P Czarnecki, P Nolmans, RP Mertens, ...
Journal of micromechanics and microengineering 17 (7), S204, 2007
382007
RF-power: driver for electrostatic RF-MEMS devices
X Rottenberg, S Brebels, W De Raedt, B Nauwelaers, HAC Tilmans
Journal of micromechanics and microengineering 14 (9), S43, 2004
372004
Effect of gas pressure on the lifetime of capacitive RF MEMS switches
P Czarnecki, X Rottenberg, R Puers, I De Wolf
19th IEEE International Conference on Micro Electro Mechanical Systems, 890-893, 2006
312006
Benchmarking time-of-flight based depth measurement techniques
A Süss, V Rochus, M Rosmeulen, X Rottenberg
Smart Photonic and Optoelectronic Integrated Circuits XVIII 9751, 199-217, 2016
302016
Modular sub-wavelength diffractive light modulator for high-definition holographic displays
R Stahl, V Rochus, X Rottenberg, S Cosemans, L Haspeslagh, S Severi, ...
Journal of Physics: Conference Series 415 (1), 012057, 2013
302013
Influence of the substrate on the lifetime of capacitive RF MEMS switches
P Czarnecki, X Rottenberg, P Soussan, P Ekkels, P Muller, P Nolmans, ...
2008 IEEE 21st International Conference on Micro Electro Mechanical Systems …, 2008
292008
New insights into charging in capacitive RF MEMS switches
P Czarnecki, X Rottenberg, P Soussan, P Nolmans, P Ekkels, P Muller, ...
2008 IEEE International Reliability Physics Symposium, 496-505, 2008
282008
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