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Vasyl P. Kladko, V.P. Klad'ko, V. Kladko, V.P. Kladko, Vasyl Kladko, В.П. Кладько
Vasyl P. Kladko, V.P. Klad'ko, V. Kladko, V.P. Kladko, Vasyl Kladko, В.П. Кладько
Corresponding Member of NAS of Ukraine, Professor, Institute of Semiconductors Physics NAS of
Verified email at isp.kiev.ua - Homepage
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Year
Low-temperature method for thermochromic high ordered VO2 phase formation
V Melnik, I Khatsevych, V Kladko, A Kuchuk, V Nikirin, B Romanyuk
Materials Letters 68, 215-217, 2012
822012
Ni-Based Ohmic Contacts to n-Type 4H-SiC: The Formation Mechanism and Thermal Stability
A.V. Kuchuk, P. Borowicz, M. Wzorek, M. Borysiewicz, R. Ratajczak, K ...
Advances in Condensed Matter Physics 2016 (Article ID 9273702), 26 pages, 2016
552016
Substrate effects on the strain relaxation in GaN/AlN short-period superlattices
V Kladko, A Kuchuk, P Lytvyn, O Yefanov, N Safriuk, A Belyaev, YI Mazur, ...
Nanoscale research letters 7 (1), 289, 2012
442012
Fabrication and characterization of nickel silicide ohmic contacts to n-type 4H silicon carbide
A Kuchuk, V Kladko, M Guziewicz, A Piotrowska, R Minikayev, A Stonert, ...
Journal of Physics: Conference Series 100 (4), 042003, 2008
422008
Internal strains and crystal structure of the layers in AlGaN/GaN heterostructures grown on a sapphire substrate
VP Kladko, AF Kolomys, MV Slobodian, VV Strelchuk, VG Raycheva, ...
Journal of applied physics 105 (6), 2009
402009
Long-term stability of Ni–silicide ohmic contact to n-type 4H–SiC
AV Kuchuk, M Guziewicz, R Ratajczak, M Wzorek, VP Kladko, ...
Microelectronic Engineering 85 (10), 2142-2145, 2008
392008
Mechanism of dislocation-governed charge transport in schottky diodes based on gallium nitride
AE Belyaev, NS Boltovets, VN Ivanov, VP Kladko, RV Konakova, ...
Semiconductors 42 (6), 689-693, 2008
39*2008
Enhanced relaxation of SiGe layers by He implantation supported by in situ ultrasonic treatments
B Romanjuk, V Kladko, V Melnik, V Popov, V Yukhymchuk, A Gudymenko, ...
Materials science in semiconductor processing 8 (1-3), 171-175, 2005
37*2005
Effect Of Doping By Transitional Elements On Properties Of Chalcogenide Glasses
A. Stronski, O. Paiuk, A. Gudymenko, V. Kladko, P. Oleksenko, N. Vuichyk, M ...
Ceramics International 41 (6), 7543–7548, 2015
362015
Investigation of indium distribution in InGaAs∕ GaAs quantum dot stacks using high-resolution x-ray diffraction and Raman scattering
YI Mazur, ZM Wang, GJ Salamo, VV Strelchuk, VP Kladko, VF Machulin, ...
Journal of Applied Physics 99 (2), 023517, 2006
36*2006
Optical characterization of the AgInS2 nanocrystals synthesized in aqueous media under stoichiometric conditions
L Borkovska, А Romanyuk, V Strelchuk, Y Polishchuk, V Kladko, ...
Materials Science in Semiconductor Processing 37 (9), 135-142, 2015
34*2015
Problems of Real Semiconductor Crystals Diagnostics
PI Baranskii, AE Belyaev, GP Gaidar, VP Klad’ko, AV Kuchuk
Nauk. Dumka, Kyiv, 462, 2014
34*2014
Modification of multifunctional properties of the magneto-resistive La0.6Sr0.15Bi0.15Mn1.1-xBxO3-Δ ceramics when replacing manganese with 3d-Ions of Cr, Fe, Co, Ni
A.V. Pashchenko, N.A. Liedienov, V.P. Pashchenko, V.K. Prokopenko, V.V ...
Journal of Alloys and Compounds 767 (10), 1117-1125, 2018
332018
Structure, Non-stoichiometry, Valence of Ions, Dielectric and Magnetic Properties of Single-Phase Bi0.9La0.1FeO3-δ Multiferroics
A.V Pashchenko,N.A Liedienov, Quanjun Li, D.D. Tatarchuk, V.A. Turchenko, I ...
Journal of Magnetism and Magnetic Materials 483, 100-113, 2019
322019
Liquid-phase sintered bismuth ferrite multiferroics and their giant dielectric constant
NA Liedienov, AV Pashchenko, VA Turchenko, VY Sycheva, AV Voznyak, ...
Ceramics International 45 (12), 14873-14879, 2019
302019
Structural transformation and functional properties of vanadium oxide films after low-temperature annealing
Yu. Goltvyanskyi, I. Khatsevych, A. Kuchuk, V. Kladko, V. Melnik, P. Lytvyn ...
Thin Solid Films 564, 179-185, 2014
302014
Effect of p-n junction overheating on degradation of silicon high-power pulsed IMPATT diodes
AE Belyaev, VV Basanets, NS Boltovets, AV Zorenko, LM Kapitanchuk, ...
Semiconductors 45, 253-259, 2011
30*2011
Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon
VB Molodkin, SI Olikhovskii, EG Len, EN Kislovskii, VP Kladko, ...
physica status solidi (a) 206 (8), 1761-1765, 2009
29*2009
On the effect of a dopant on the formation of disordered regions in GaAs under irradiation with fast neutrons
VP Klad’ko, SV Plyatsko
Semiconductors 32 (3), 235-237, 1998
29*1998
Functionalization of 2D macroporous silicon under the high-pressure oxidation
L Karachevtseva, M Kartel, V Kladko, O Gudymenko, W Bo, V Bratus, ...
Applied Surface Science 434, 142-147, 2018
282018
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