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René Just
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Defects4J: A database of existing faults to enable controlled testing studies for Java programs
R Just, D Jalali, MD Ernst
Proceedings of the 2014 international symposium on software testing and …, 2014
12672014
Are mutants a valid substitute for real faults in software testing?
R Just, D Jalali, L Inozemtseva, MD Ernst, R Holmes, G Fraser
Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations …, 2014
7032014
Evaluating and improving fault localization
S Pearson, J Campos, R Just, G Fraser, R Abreu, MD Ernst, D Pang, ...
2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE …, 2017
4482017
Do Automatically Generated Unit Tests Find Real Faults? An Empirical Study of Effectiveness and Challenges
S Shamshiri, R Just, JM Rojas, G Fraser, P McMinn, A Arcuri
Automated Software Engineering (ASE), 2015 30th IEEE/ACM International …, 2015
2662015
The Major mutation framework: Efficient and scalable mutation analysis for Java
R Just
Proceedings of the 2014 international symposium on software testing and …, 2014
2612014
MAJOR: An efficient and extensible tool for mutation analysis in a Java compiler
R Just, F Schweiggert, GM Kapfhammer
2011 26th IEEE/ACM International Conference on Automated Software …, 2011
1652011
Collaborative verification of information flow for a high-assurance app store
MD Ernst, R Just, S Millstein, W Dietl, S Pernsteiner, F Roesner, ...
Proceedings of the 2014 ACM SIGSAC Conference on Computer and Communications …, 2014
1292014
Efficient mutation analysis by propagating and partitioning infected execution states
R Just, MD Ernst, G Fraser
Proceedings of the 2014 international symposium on software testing and …, 2014
1112014
Code coverage at Google
M Ivanković, G Petrović, R Just, G Fraser
Proceedings of the 2019 27th ACM Joint Meeting on European Software …, 2019
982019
Static Analysis of Implicit Control Flow: Resolving Java Reflection and Android Intents
P Barros, R Just, S Millstein, P Vines, W Dietl, MD Ernst
Automated Software Engineering (ASE), 2015 30th IEEE/ACM International …, 2015
972015
Using non-redundant mutation operators and test suite prioritization to achieve efficient and scalable mutation analysis
R Just, GM Kapfhammer, F Schweiggert
2012 IEEE 23rd International Symposium on Software Reliability Engineering …, 2012
912012
Do redundant mutants affect the effectiveness and efficiency of mutation analysis?
R Just, GM Kapfhammer, F Schweiggert
2012 IEEE Fifth International Conference on Software Testing, Verification …, 2012
872012
Do automated program repair techniques repair hard and important bugs?
M Motwani, S Sankaranarayanan, R Just, Y Brun
Proceedings of the 40th International Conference on Software Engineering, 25-25, 2018
842018
An Industrial Application of Mutation Testing: Lessons, Challenges, and Research Directions
G Petrovic, M Ivankovic, B Kurtz, P Ammann, R Just
Software testing, verification and validation (ICSTW), 2018, 2018
652018
Inferring mutant utility from program context
R Just, B Kurtz, P Ammann
Proceedings of the 26th ACM SIGSOFT International Symposium on Software …, 2017
642017
Higher accuracy and lower run time: efficient mutation analysis using non‐redundant mutation operators
R Just, F Schweiggert
Software Testing, Verification and Reliability 25 (5-7), 490-507, 2015
592015
Private api access and functional mocking in automated unit test generation
A Arcuri, G Fraser, R Just
2017 IEEE international conference on software testing, verification and …, 2017
502017
Quality of automated program repair on real-world defects
M Motwani, M Soto, Y Brun, R Just, C Le Goues
IEEE Transactions on Software Engineering 48 (2), 637-661, 2020
492020
Revisiting the relationship between fault detection, test adequacy criteria, and test set size
YT Chen, R Gopinath, A Tadakamalla, MD Ernst, R Holmes, G Fraser, ...
Proceedings of the 35th IEEE/ACM international conference on automated …, 2020
472020
Evaluating and improving fault localization. In 2017 IEEE/ACM 39th International Conference on Software Engineering (ICSE)
S Pearson, J Campos, R Just, G Fraser, R Abreu, MD Ernst, D Pang, ...
IEEE, IEEE, New York, USA, 609-620, 2017
422017
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