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Isra Mahaboob
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Influence of mask material on the electrical properties of selective area epitaxy GaN microstructures
I Mahaboob, K Hogan, SW Novak, F Shahedipour-Sandvik, RP Tompkins, ...
Journal of Vacuum Science & Technology B 36 (3), 2018
262018
Visible-blind APD heterostructure design with superior field confinement and low operating voltage
J Bulmer, P Suvarna, J Leathersich, J Marini, I Mahaboob, N Newman, ...
IEEE Photonics Technology Letters 28 (1), 39-42, 2015
262015
Polarization engineered N-polar Cs-free GaN photocathodes
J Marini, I Mahaboob, E Rocco, LD Bell, F Shahedipour-Sandvik
Journal of Applied Physics 124 (11), 2018
252018
MOCVD growth of N-polar GaN on on-axis sapphire substrate: impact of AlN nucleation layer on GaN surface hillock density
J Marini, J Leathersich, I Mahaboob, J Bulmer, N Newman, ...
Journal of Crystal Growth 442, 25-30, 2016
252016
Hillock assisted p-type enhancement in N-polar GaN:Mg flms grown by MOCVD
E Rocco, I Mahaboob, K Hogan, T Sean
Scientific Reports 10 (1426), 2020
212020
Dynamic Control of AlGaN/GaN HEMT Characteristics by Implementation of a p-GaN Body-diode based Back-gate
I Mahaboob, M Yakimov, K Hogan, E Rocco, S Tozier, ...
IEEE Journal of the Electron Devices Society 7 (1), 581 - 588, 2019
202019
Ion implantation-based edge termination to improve III-N APD reliability and performance
P Suvarna, J Bulmer, JM Leathersich, J Marini, I Mahaboob, J Hennessy, ...
IEEE Photonics Technology Letters 27 (5), 498-501, 2014
192014
Selective area epitaxial growth of stretchable geometry AlGaN-GaN heterostructures
I Mahaboob, J Marini, K Hogan, E Rocco, RP Tompkins, N Lazarus, ...
Journal of Electronic Materials 47, 6625-6634, 2018
182018
Mg incorporation efficiency in pulsed MOCVD of N-polar GaN: Mg
J Marini, I Mahaboob, K Hogan, S Novak, LD Bell, ...
Journal of Electronic Materials 46 (10), 5820-5826, 2017
172017
Electrical properties of AlGaN/GaN HEMTs in stretchable geometries
RP Tompkins, I Mahaboob, F Shahedipour-Sandvik, N Lazarus
Solid-State Electronics 136, 36-42, 2017
162017
Mechanical analysis of stretchable AlGaN/GaN high electron mobility transistors
RP Tompkins, I Mahaboob, S Shahedipour-Sandvik, N Lazarus
ECS Transactions 72 (5), 89, 2016
122016
Drain-Voltage-Induced Secondary Effects in AlGaN/GaN HEMTs With Integrated Body-Diode
I Mahaboob, M Yakimov, E Rocco, K Hogan, FS Shahedipour-Sandvik
IEEE Transactions on Electron Devices, 2020
72020
Investigation of the electrical behavior of AlGaN/GaN high electron mobility transistors grown with underlying GaN: Mg layer
I Mahaboob, SW Novak, E Rocco, K Hogan, F Shahedipour-Sandvik
Journal of Vacuum Science & Technology B 38 (6), 2020
52020
Removal of Dry-Etch-Induced Surface Layer Damage from p-GaN by Photoelectrochemical Etching
V Meyers, E Rocco, K Hogan, S Tozier, B McEwen, I Mahaboob, ...
Journal of Electronic Materials 49, 3481-3489, 2020
52020
Impurity incorporation and diffusion from regrowth interfaces in N-polar GaN photocathodes and the impact on quantum efficiency
E Rocco, I Mahaboob, K Hogan, V Meyers, B McEwen, LD Bell, ...
Journal of Applied Physics 129 (19), 2021
42021
Boronate probe-based hydrogen peroxide detection with AlGaN/GaN HEMT sensor
I Mahaboob, RJ Reinertsen, B McEwen, K Hogan, E Rocco, JA Melendez, ...
Experimental Biology and Medicine 246 (5), 523-528, 2021
42021
Investigation of the Effects of Forming Gas Annealing on Al2O3/GaN Interface
B McEwen, I Mahaboob, E Rocco, K Hogan, V Meyers, R Green, ...
Journal of Electronic Materials 50, 80-84, 2021
42021
Novel gyrotron beam annealing method for Mg-implanted bulk GaN
K Hogan, S Tozier, E Rocco, I Mahaboob, V Meyers, B McEwen, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019
42019
Enhanced p-type conductivity in N-polar GaN photocathode structures and correlation with GaN hillock density (Conference Presentation)
E Rocco, I Mahaboob, K Hogan, S Tozier, V Meyers, B McEwen, S Novak, ...
Gallium Nitride Materials and Devices XIV 10918, 109180Y, 2019
12019
A-plane GaN epitaxial lateral overgrowth structures: growth domains, morphological defects, and impurity incorporation directly imaged by cathodoluminescence microscopy …
K Hogan, S Metzner, F Bertram, I Mahaboob, E Rocco, ...
Gallium Nitride Materials and Devices XIII 10532, 105320V, 2018
12018
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Articles 1–20