Real-time Malaysian sign language translation using colour segmentation and neural network R Akmeliawati, MPL Ooi, YC Kuang 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 1-6, 2007 | 139 | 2007 |
The fourth industrial revolution-Industry 4.0 and IoT [Trends in Future I&M] F Griffiths, M Ooi IEEE Instrumentation & Measurement Magazine 21 (6), 29-43, 2018 | 102 | 2018 |
Choice of rainfall inputs for event-based rainfall-runoff modeling in a catchment with multiple rainfall stations using data-driven techniques TK Chang, A Talei, S Alaghmand, MPL Ooi Journal of Hydrology 545, 100-108, 2017 | 73 | 2017 |
Multivariate alternating decision trees HK Sok, MPL Ooi, YC Kuang, S Demidenko Pattern Recognition 50, 195-209, 2016 | 71 | 2016 |
Low-cost microcontroller-based hover control design of a quadcopter BTM Leong, SM Low, MPL Ooi Procedia Engineering 41, 458-464, 2012 | 71 | 2012 |
Defect cluster recognition system for fabricated semiconductor wafers MPL Ooi, HK Sok, YC Kuang, S Demidenko, C Chan Engineering Applications of Artificial Intelligence 26 (3), 1029-1043, 2013 | 59 | 2013 |
Reducing burn-in time through high-voltage stress test and Weibull statistical analysis MF Zakaria, ZA Kassim, MPL Ooi, S Demidenko IEEE Design & Test of computers 23 (2), 88-98, 2006 | 57 | 2006 |
Getting more from the semiconductor test: Data mining with defect-cluster extraction MPL Ooi, EKJ Joo, YC Kuang, S Demidenko, L Kleeman, CWK Chan IEEE Transactions on Instrumentation and Measurement 60 (10), 3300-3317, 2011 | 43 | 2011 |
Shortening burn-in test: Application of HVST and Weibull statistical analysis MPL Ooi, ZA Kassim, SN Demidenko IEEE Transactions on instrumentation and measurement 56 (3), 990-999, 2007 | 39 | 2007 |
Moment-constrained maximum entropy method for expanded uncertainty evaluation A Rajan, YC Kuang, MPL Ooi, SN Demidenko, H Carstens IEEE Access 6, 4072-4082, 2018 | 31 | 2018 |
Impact of circadian tuning on the illuminance and color uniformity of a multichannel luminaire with spatially optimized LED placement SK Abeysekera, V Kalavally, M Ooi, YC Kuang Optics express 28 (1), 130-145, 2020 | 28 | 2020 |
Benchmark test distributions for expanded uncertainty evaluation algorithms A Rajan, YC Kuang, MPL Ooi, SN Demidenko IEEE Transactions on Instrumentation and Measurement 65 (5), 1022-1034, 2015 | 27 | 2015 |
Sparse alternating decision tree HK Sok, MPL Ooi, YC Kuang Pattern Recognition Letters 60, 57-64, 2015 | 27 | 2015 |
Analytical standard uncertainty evaluation using Mellin transform A Rajan, MPL Ooi, YC Kuang, SN Demidenko IEEE Access 3, 209-222, 2015 | 27 | 2015 |
Towards real-time sign language analysis via markerless gesture tracking R Akmeliawati, F Dadgostar, S Demidenko, N Gamage, YC Kuang, ... 2009 IEEE Instrumentation and Measurement Technology Conference, 1200-1204, 2009 | 27 | 2009 |
Standard uncertainty evaluation of multivariate polynomial YC Kuang, A Rajan, MPL Ooi, TC Ong Measurement 58, 483-494, 2014 | 25 | 2014 |
Hardware implementation for face detection on Xilinx Virtex-II FPGA using the reversible component transformation colour space MPL Ooi Third IEEE International Workshop on Electronic Design, Test and …, 2006 | 25 | 2006 |
Statistical measures of two dimensional point set uniformity MS Ong, YC Kuang, MPL Ooi Computational Statistics & Data Analysis 56 (6), 2159-2181, 2012 | 24 | 2012 |
A simulation-based probabilistic framework for lithium-ion battery modelling A Rajan, V Vijayaraghavan, MPL Ooi, A Garg, YC Kuang Measurement 115, 87-94, 2018 | 21 | 2018 |
Automatic defect cluster extraction for semiconductor wafers MPL Ooi, EKJ Sim, YC Kuang, L Kleeman, C Chan, S Demidenko 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings …, 2010 | 20 | 2010 |