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Enrico Colla
Enrico Colla
Institute of Materials, EPFL, Lausanne
Verified email at infoprint.ch
Title
Cited by
Cited by
Year
Dielectric and structural characteristics of Ba-and Sr-based complex perovskites as a function of tolerance factor
IM Reaney, ELCEL Colla, NSN Setter
Japanese Journal of Applied Physics 33 (7R), 3984, 1994
7361994
Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features
AK Tagantsev, I Stolichnov, EL Colla, N Setter
Journal of Applied Physics 90 (3), 1387-1402, 2001
7222001
Effect of structural changes in complex perovskites on the temperature coefficient of the relative permittivity
EL Colla, IM Reaney, N Setter
Journal of Applied Physics 74 (5), 3414-3425, 1993
4971993
Principle of ferroelectric domain imaging using atomic force microscope
S Hong, J Woo, H Shin, JU Jeon, YE Pak, EL Colla, N Setter, E Kim, K No
Journal of Applied Physics 89 (2), 1377-1386, 2001
3852001
Identification of passive layer in ferroelectric thin films from their switching parameters
AK Tagantsev, M Landivar, E Colla, N Setter
Journal of applied physics 78 (4), 2623-2630, 1995
3131995
Direct observation of region by region suppression of the switchable polarization (fatigue) in thin film capacitors with Pt electrodes
EL Colla, S Hong, DV Taylor, AK Tagantsev, N Setter, K No
Applied Physics Letters 72 (21), 2763-2765, 1998
2641998
Discrimination between bulk and interface scenarios for the suppression of the switchable polarization (fatigue) in thin films capacitors with Pt electrodes
EL Colla, DV Taylor, AK Tagantsev, N Setter
Applied physics letters 72 (19), 2478-2480, 1998
2571998
High resolution study of domain nucleation and growth during polarization switching in ferroelectric thin film capacitors
S Hong, EL Colla, E Kim, DV Taylor, AK Tagantsev, P Muralt, K No, ...
Journal of applied physics 86 (1), 607-613, 1999
1761999
Dielectric spectroscopy of Ba(B1/2B1/2)O3 complex perovskite ceramics: Correlations between ionic parameters and microwave dielectric properties. I. Infrared reflectivity study (10 …
R Zurmühlen, J Petzelt, S Kamba, VV Voitsekhovskii, E Colla, N Setter
Journal of applied physics 77 (10), 5341-5350, 1995
1681995
Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films
AL Kholkin, EL Colla, AK Tagantsev, DV Taylor, N Setter
Applied physics letters 68 (18), 2577-2579, 1996
1601996
Ferroelectric ceramics: tutorial reviews, theory, processing, and applications
N Setter, EL Colla
Birkhäuser, 1993
1481993
Piezoelectric response and polarization switching in small anisotropic perovskite particles
G Suyal, E Colla, R Gysel, M Cantoni, N Setter
Nano Letters 4 (7), 1339-1342, 2004
1242004
Polarization reversal due to charge injection in ferroelectric films
S Bühlmann, E Colla, P Muralt
Physical Review B 72 (21), 214120, 2005
1012005
Fatigued state of the Pt-PZT-Pt system
EL Colla, AK Tagantsev, DV Taylor, AL Kholkin
Integrated Ferroelectrics 18 (1-4), 19-28, 1997
891997
Ferroelectric domains and piezoelectricity in monocrystalline Pb (Zr, Ti) O3 nanowires
J Wang, CS Sandu, E Colla, Y Wang, W Ma, R Gysel, HJ Trodahl, N Setter, ...
Applied Physics Letters 90 (13), 2007
812007
Bent ferroelectric domain walls as reconfigurable metallic-like channels
I Stolichnov, L Feigl, LJ McGilly, T Sluka, XK Wei, E Colla, A Crassous, ...
Nano letters 15 (12), 8049-8055, 2015
772015
Uniaxial stress dependence of the permittivity of electroceramics
O Steiner, AK Tagantsev, EL Colla, N Setter
Journal of the European Ceramic Society 19 (6-7), 1243-1246, 1999
731999
Persistent conductive footprints of 109 domain walls in bismuth ferrite films
I Stolichnov, M Iwanowska, E Colla, B Ziegler, I Gaponenko, P Paruch, ...
Applied Physics Letters 104 (13), 2014
662014
Structure of Ba(Y+31/2Ta+51/2)O3 and its dielectric properties in the range 102–1014 Hz, 20–600 K
R Zurmühlen, E Colla, DC Dube, J Petzelt, I Reaney, A Bell, N Setter
Journal of applied physics 76 (10), 5864-5873, 1994
641994
Characterisation of the fatigued state of ferroelectric PZT thin-film capacitors
EL Colla, AL Kholkin, D Taylor, AK Tagantsev, KG Brooks, N Setter
Microelectronic engineering 29 (1-4), 145-148, 1995
631995
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