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Dr. Suresh Balanethiram
Dr. Suresh Balanethiram
Assistant Professor, Dept. of ECE, National Institute of Technology Puducherry, Karaikal
Verified email at nitpy.ac.in - Homepage
Title
Cited by
Cited by
Year
The common language of speech perception and action: a neurocognitive perspective
JL Schwartz, M Sato, L Fadiga
Revue française de linguistique appliquée 13 (2), 9-22, 2008
322008
Analytic estimation of thermal resistance in HBTs
A Chakravorty, R D’Esposito, S Balanethiram, S Frégonèse, T Zimmer
IEEE Transactions on Electron Devices 63 (8), 2994-2998, 2016
232016
Extracting the temperature dependence of thermal resistance from temperature-controlled DC measurements of sige HBTs
S Balanethiram, R d'Esposito, S Fregonese, T Zimmer, J Berkner, D Celi
2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 94-97, 2017
212017
Accurate modeling of thermal resistance for on-wafer SiGe HBTs using average thermal conductivity
S Balanethiram, A Chakravorty, R D’Esposito, S Fregonese, D Céli, ...
IEEE Transactions on Electron Devices 64 (9), 3955-3960, 2017
202017
Thermal penetration depth analysis and impact of the BEOL metals on the thermal impedance of SiGe HBTs
R D’Esposito, S Balanethiram, JL Battaglia, S Frégonèse, T Zimmer
IEEE Electron Device Letters 38 (10), 1457-1460, 2017
192017
Extraction of BEOL contributions for thermal resistance in SiGe HBTs
S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, T Zimmer
IEEE Transactions on Electron Devices 64 (3), 1380-1384, 2017
142017
An improved scalable self-consistent iterative model for thermal resistance in SiGe HBTs
S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer
2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 150-153, 2016
112016
One-shot face recognition
KV Kumar, KA Teja, RT Bhargav, V Satpute, C Naveen, V Kamble
2023 2nd International Conference on Paradigm Shifts in Communications …, 2023
82023
Validation of thermal resistance extracted from measurements on stripe geometry SiGe HBTs
S Balanethiram, R D’Esposito, S Fregonese, A Chakravorty, T Zimmer
IEEE Transactions on Electron Devices 66 (10), 4151-4155, 2019
62019
Efficient modeling of distributed dynamic self-heating and thermal coupling in multifinger SiGe HBTs
S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, D Céli, ...
IEEE Transactions on Electron Devices 63 (9), 3393-3398, 2016
62016
Influence of the BEOL metallization design on the overall performances of SiGe HBTs
R D'Esposito, M De Matos, S Fregonese, S Balanethiram, A Chakravorty, ...
2016 13th IEEE International Conference on Solid-State and Integrated …, 2016
52016
Efficient modeling of static self-heating and thermal-coupling in multi-finger SiGe HBTs
S Balanethiram, A Chakravorty, R d'Esposito, S Fregonese, T Zimmer
2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting-BCTM, 68-71, 2015
52015
An efficient thermal model for multifinger SiGe HBTs under real operating condition
K Nidhin, S Pande, S Yadav, S Balanethiram, DR Nair, S Fregonese, ...
IEEE Transactions on Electron Devices 67 (11), 5069-5075, 2020
42020
Static thermal coupling factors in multi-finger bipolar transistors: Part I—model development
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1333, 2020
42020
Extraction of true finger temperature from measured data in multifinger bipolar transistors
A Gupta, K Nidhin, S Balanethiram, R D’Esposito, S Fregonese, T Zimmer, ...
IEEE Transactions on Electron Devices 68 (3), 1385-1388, 2021
32021
Static thermal coupling factors in multi-finger bipolar transistors: Part II-experimental validation
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1365, 2020
32020
Device level analysis of threshold voltage variation in FinFET with varied design parameters
DJ Moni, R Malarkodi, B Suresh
2011 International Conference on Computer, Communication and Electrical …, 2011
32011
A physics-based compact model of thermal resistance in RRAMs
S Pande, S Balanethiram, B Chakrabarti, A Chakravorty
Solid-State Electronics 204, 108636, 2023
22023
Development of low-cost silicon bicmos technology for rf applications
S Balanethiram, S Pande, AK Singh, B Umapathi, HS Jatana, ...
2019 IEEE Conference on Modeling of Systems Circuits and Devices (MOS-AK …, 2019
22019
Extracting the FEOL and BEOL components of thermal resistance in SiGe HBTs
S Balanethiram, A Chakravorty, R D'Esposito, S Fregonese, T Zimmer
2016 3rd International Conference on Emerging Electronics (ICEE), 1-4, 2016
22016
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