| Microstructure, residual stress and hardness study of nanocrystalline titanium–zirconium nitride thin films D Escobar, R Ospina, AG Gómez, E Restrepo-Parra Ceramics International 41 (1), 947-952, 2015 | 31 | 2015 |
| Residual stresses in titanium nitride thin films obtained with step variation of substrate bias voltage during deposition AG Gómez, AAC Recco, NB Lima, LG Martinez, AP Tschiptschin, ... Surface and Coatings Technology 204 (20), 3228-3233, 2010 | 27 | 2010 |
| Tempering temperature effects on abrasive wear of mottled cast iron JJ Coronado, A Gómez, A Sinatora Wear 267 (11), 2070-2076, 2009 | 26 | 2009 |
| A mechanical and tribological study of Cr/CrN multilayer coatings JJO D.F. Arias, A. Gomez, J.M. Velez, R.M. Souza Materials Chemistry and Physics 160, 131-140, 2015 | 22 | 2015 |
| SenSARS: A low-cost portable electrochemical system for ultra-sensitive, near real-time, diagnostics of SARS-CoV-2 infections SA Perdomo, V Ortega, A Jaramillo-Botero, N Mancilla, ... IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021 | 21 | 2021 |
| Quantitative analysis of aluminum dross by the Rietveld method A Gómez, L NB, T JA Materials transactions 49 (4), 728-732, 2008 | 21 | 2008 |
| Effects of mechanical properties, residual stress and indenter tip geometry on instrumented indentation data in thin films CEK Mady, SA Rodriguez, AG Gómez, RM Souza Surface and Coatings Technology 205 (5), 1393-1397, 2010 | 16 | 2010 |
| Residual stress gradient of Cr and CrN thin films DF Arias, A Gómez, RM Souza, JM Vélez Materials Chemistry and Physics 204, 269-276, 2018 | 15 | 2018 |
| Numerical analysis of different methods to calculate residual stresses in thin films based on instrumented indentation data CEK Mady, SA Rodriguez, AG Gómez, RM Souza Journal of Materials Research 27 (13), 1732-1741, 2012 | 14 | 2012 |
| X-ray microstructural analysis of nanocrystalline TiZrN thin films by diffraction pattern modeling D Escobar, R Ospina, AG Gomez, E Restrepo-Parra, PJ Arango Materials characterization 88, 119-126, 2014 | 13 | 2014 |
| Circular Economy: Adding Value to the Post-Industrial Waste through the Transformation of Aluminum Dross for Cement Matrix Applications MF Muñoz-Vélez, K Salazar-Serna, D Escobar-Torres, ... Sustainability 15 (18), 13952, 2023 | 2 | 2023 |
| Estudo experimental e numérico dos efeitos das tensões residuais nos resultados do ensaio de indentação instrumentada e viabilidade do cálculo em filmes CEK Mady São Paulo: Trabalho de Formatura EPUSP, 2009 | 1 | 2009 |
| Cálculo de tensões residuais em filmes finos através de difração de raios-X com ângulo de incidência rasante CEK Mady, AG Gómez, RM Souza, DK Tanaka ENCONTRO DE INICIAÇÃO CIENTÍFICA DO LABORATÓRIO DE FENÔMENOS DE SUPERFÍCIE 9 …, 2008 | 1 | 2008 |
| Residual stress in TiN thin films studied by the grazing incidence X-ray diffraction method AG Gomez, AAC Recco, LG Martinez LNLS Activity Report, 2007 | 1 | 2007 |
| Mechanical Performance of Mortars with Partial Replacement of Cement by Aluminum Dross: Inactivation and Particle Size D Parra-Molina, MA Rojas-Manzano, A Gómez-Gómez, MF Muñoz-Vélez, ... Sustainability 15 (19), 14224, 2023 | | 2023 |
| Metadiseño curricular basado en competencias para programas de pregrado de la Facultad de Ingeniería y Ciencias en Javeriana Cali J Álvarez, O Cundumí, A Gómez, C Rocha, L Tobón Encuentro Internacional de Educación en Ingeniería, 2023 | | 2023 |
| Relación entre el tamaño de partícula y el contenido de las fases cristalinas presentes en una escoria de aluminio A Gómez-Gómez, LE Vinasco-Isaza, NB Lima, JAS Tenório Dyna 85 (206), 348-354, 2018 | | 2018 |
| Relationship between the particle size and the crystalline phases amount of an aluminum dross STJA Gómez-Gomez, A., Vinasco-Isaza L.E., Batista de Lima, N. Dyna 85, 348-354, 2018 | | 2018 |
| Análise de gradientes de tensões residuais em filmes finos de nitreto de titânio utilizando métodos de difração de raios X com ângulo de incidência rasante A Gómez Gómez, AAC Recco, DE Rincon, RM Souza Anais, 2012 | | 2012 |
| Measurement of residual strains in fine films by X-ray diffraction with low incidence angle; Medicao de tensoes residuais em filmes finos por difracao de raios X com angulo de … AG Gomez, AAC Recco, LG Martinez | | 2009 |
Nelson Batista de LimaIPENVerified email at ipen.br
