| First principles design of dye molecules with ullazine donor for dye sensitized solar cells J Feng, Y Jiao, W Ma, MK Nazeeruddin, M Grätzel, S Meng The Journal of Physical Chemistry C 117 (8), 3772-3778, 2013 | 208 | 2013 |
| Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks C Zhang, J Feng, LR DaCosta, PM Voyles Ultramicroscopy 210, 112921, 2020 | 41 | 2020 |
| Local Dielectric Breakdown Path along c‐Axis Planar Boundaries in Cr2O3 Thin Films C Sun, Z Song, A Rath, M Street, W Echtenkamp, J Feng, C Binek, ... Advanced Materials Interfaces 4 (20), 1700172, 2017 | 25 | 2017 |
| Bis (pyrazol‐1‐yl) methane as Non‐Chromophoric Ancillary Ligand for Charged Bis‐Cyclometalated Iridium (III) Complexes S Meng, I Jung, J Feng, R Scopelliti, D Di Censo, M Grätzel, ... European Journal of Inorganic Chemistry 2012 (19), 3209-3215, 2012 | 17 | 2012 |
| Reduced interface spin polarization by antiferromagnetically coupled Mn segregated to the /GaAs (001) interface A Rath, C Sivakumar, C Sun, SJ Patel, JS Jeong, J Feng, G Stecklein, ... Physical Review B 97 (4), 045304, 2018 | 15 | 2018 |
| Fast approximate STEM image simulations from a machine learning model AH Combs, JJ Maldonis, J Feng, Z Xu, PM Voyles, D Morgan Advanced Structural and Chemical Imaging 5, 1-10, 2019 | 10 | 2019 |
| Three-dimensional imaging of single La vacancies in LaMnO3 J Feng, AV Kvit, C Zhang, D Morgan, PM Voyles Microscopy and Microanalysis 22 (S3), 902-903, 2016 | 5 | 2016 |
| Optimizing nonrigid registration for scanning transmission electron microscopy image series C Zhang, J Feng, AB Yankovich, A Kvit, B Berkels, PM Voyles Microscopy and Microanalysis 27 (1), 90-98, 2021 | 4 | 2021 |
| Imaging of Single La Vacancies in LaMnO J Feng, AV Kvit, C Zhang, J Hoffman, A Bhattacharya, D Morgan, ... arXiv preprint arXiv:1711.06308, 2017 | 4 | 2017 |
| Bayesian statistical model for imaging of single La vacancies in LaMnO3 J Feng, AV Kvit, C Zhang, D Morgan, PM Voyles Microscopy and Microanalysis 23 (S1), 1572-1573, 2017 | 3 | 2017 |
| High-precision stress mapping and defect characterization of thin films of LaMnO3grown on DyScO3substrate. AV Kvit, J Feng, C Zhang, D Morgan, PM Voyles Microscopy and Microanalysis 22 (S3), 1526-1527, 2016 | 2 | 2016 |
| Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy J Feng, AV Kvit, AB Yankovich, C Zhang, D Morgan, PM Voyles Microscopy and Microanalysis 21 (S3), 1887-1888, 2015 | 2 | 2015 |
| Quantitative Scanning Transmission Electron Microscopy of Point Defects in Crystals J Feng The University of Wisconsin-Madison, 2018 | 1 | 2018 |
| Applications of High Precision STEM Imaging to Structurally Complex Materials J Feng, C Zhang, D Zhou, Z Xu, D Morgan, PM Voyles Microscopy and Microanalysis 23 (S1), 418-419, 2017 | 1 | 2017 |
| Exposing New Atomic‐scale Information about Materials by Improving the Quality and Quantifiability of Aberration‐corrected STEM Data A Yankovich, T Pingel, J Feng, A Kvit, T Slater, S Haigh, D Morgan, ... European Microscopy Congress 2016: Proceedings, 495-496, 2016 | 1 | 2016 |
| Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3 AV Kvit, J Feng, AB Yankovich, D Morgan, PM Voyles Microscopy and Microanalysis 21 (S3), 2413-2414, 2015 | 1 | 2015 |
| Dielectric breakdown along c-axis boundaries in magnetoelectric O2O3 for spintronic devices C Sun, Z Song, M Street, W Echtenkamp, J Feng, C Binek, D Morgan, ... Microscopy and Microanalysis 23 (S1), 1442-1443, 2017 | | 2017 |
| Revealing new atomic-scale information about materials by improving the quality and quantifiability of aberration-corrected STEM data AB Yankovich, J Feng, A Kvit, T Slater, S Haigh, D Morgan, PM Voyles Microscopy and Microanalysis 21 (S3), 2409-2410, 2015 | | 2015 |
Paul VoylesUniversity of Wisconsin, MadisonVerified email at wisc.edu
