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Tiago Balen
Tiago Balen
Verified email at ufrgs.br
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Cited by
Cited by
Year
Fault detection, diagnosis and prediction in electrical valves using self-organizing maps
LF Gonšalves, JL Bosa, TR Balen, MS Lubaszewski, EL Schneider, ...
Journal of Electronic Testing 27, 551-564, 2011
482011
Applying the oscillation test strategy to FPAA’s configurable analog blocks
TR Balen, AQ Andrade, F Aza´s, M Lubaszewski, M Renovell
Journal of Electronic Testing 21, 135-146, 2005
222005
A self-checking scheme to mitigate single event upset effects in SRAM-based FPAAs
TR Balen, F Leite, FL Kastensmidt, M Lubaszewski
IEEE transactions on nuclear science 56 (4), 1950-1957, 2009
212009
Using bulk built-in current sensors and recomputing techniques to mitigate transient faults in microprocessors
F Leite, T Balen, M Herve, M Lubaszewski, G Wirth
2009 10th Latin American Test Workshop, 1-6, 2009
212009
Built-in self-test of field programmable analog arrays based on transient response analysis
TR Balen, JV Calvano, MS Lubaszewski, M Renovell
Journal of Electronic Testing 23, 497-512, 2007
202007
Functional test of field programmable analog arrays
TR Balen, JV Calvano, MS Lubaszewski, M Renovelf
24th IEEE VLSI Test Symposium, 6 pp.-333, 2006
182006
Built-in self-test of global interconnects of field programmable analog arrays
A Andrade Jr, G Vieira, TR Balen, M Lubaszewski, F Aza´s, M Renovell
Microelectronics Journal 36 (12), 1112-1123, 2005
182005
Exploring design diversity redundancy to improve resilience in mixed-signal systems
CP Chenet, LA Tambara, GM de Borges, F Kastensmidt, MS Lubaszewski, ...
microelectronics Reliability 55 (12), 2833-2844, 2015
162015
Testing the interconnect networks and I/O resources of field programmable analog arrays
G Pereira, M Lubaszewski, A Andrade, TR Balen, F Aza´s, M Renovell
23rd IEEE VLSI Test Symposium (VTS'05), 389-394, 2005
162005
Testing the configurable analog blocks of field programmable analog arrays
T Balen, A Andrade, F Aza´s, M Lubaszewski, M Renovell
2004 International Conferce on Test, 893-902, 2004
162004
An approach to the built-in self-test of field programmable analog arrays
T Balen, A Andrade, F Aza´s, M Lubaszewski, M Renovell
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 383-388, 2004
162004
Single event transient effects on charge redistribution SAR ADCs
TE Becker, AJC Lanot, GS Cardoso, TR Balen
Microelectronics Reliability 73, 22-35, 2017
142017
Analyzing the behavior of FinFET SRAMs with resistive defects
TS Copetti, TR Balen, GC Medeiros, LMB Poehls
2017 IFIP/IEEE International Conference on Very Large Scale Integrationá…, 2017
132017
Analysis of the effects of single event transients on an sar-adc based on charge redistribution
AJC Lanot, TR Balen
2014 15th Latin American Test Workshop-LATW, 1-5, 2014
122014
Reliability Analysis of 0.5 μm CMOS Operational Amplifiers under TID Effects
GS Cardoso, TR Balen, MS Lubaszewski, OL Gonšalez
Journal of Integrated Circuits and Systems 9 (1), 70-79, 2014
122014
TID effects on a data acquisition system with design diversity redundancy
CJ Gonzalez, RG Vaz, MB Oliveira, VW Leorato, OL Goncalez, TR Balen
IEEE Transactions on Nuclear Science 65 (1), 583-590, 2017
112017
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC
L Tambara, F Kastensmidt, P Rech, T Balen, M Lubaszewski
2013 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 188-193, 2013
112013
TID in a switched-capacitor FPAA: Degradation and partial inactivity windows due to compensating effects in MOS transistors
TR Balen, RG Vaz, GS Cardoso, OL Goncalez, MS Lubaszewski
IEEE Transactions on Nuclear Science 58 (6), 2883-2889, 2011
112011
Qualification of electronic components with respect to the cosmic radiation tolerance for space applications
OL Gonšalez, ECF PEREIRA JUNIOR, RG VAZ, MA PEREIRA, GI WIRTH, ...
4║ Workshop sobre os efeitos da radiašŃo ionizante em componentesá…, 2012
102012
Study of layout extraction accuracy on W/L estimation of ELT in analog design flow
GS Cardoso, TR Balen
2016 IEEE 7th Latin American Symposium on Circuits & Systems (LASCAS), 279-282, 2016
92016
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Articles 1–20