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Aaron Hagerstrom
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Experimental observation of chimeras in coupled-map lattices
AM Hagerstrom, TE Murphy, R Roy, P H÷vel, I Omelchenko, E Sch÷ll
Nature Physics 8 (9), 658-661, 2012
6092012
Cluster synchronization and isolated desynchronization in complex networks with symmetries
LM Pecora, F Sorrentino, AM Hagerstrom, TE Murphy, R Roy
Nature communications 5 (1), 4079, 2014
5072014
Complete characterization of the stability of cluster synchronization in complex dynamical networks
F Sorrentino, LM Pecora, AM Hagerstrom, TE Murphy, R Roy
Science advances 2 (4), e1501737, 2016
2112016
Local negative permittivity and topological phase transition in polar skyrmions
S Das, Z Hong, VA Stoica, MAP Gonšalves, YT Shao, E Parsonnet, ...
Nature materials 20 (2), 194-201, 2021
822021
Chaotic spin-wave solitons in magnetic film feedback rings
Z Wang, A Hagerstrom, JQ Anderson, W Tong, M Wu, LD Carr, R Eykholt, ...
Physical review letters 107 (11), 114102, 2011
492011
Excitation of chaotic spin waves through modulational instability
M Wu, AM Hagerstrom, R Eykholt, A Kondrashov, BA Kalinikos
Physical review letters 102 (23), 237203, 2009
392009
Harvesting entropy and quantifying the transition from noise to chaos in a photon-counting feedback loop
AM Hagerstrom, TE Murphy, R Roy
Proceedings of the National Academy of Sciences 112 (30), 9258-9263, 2015
332015
Excitation of chaotic spin waves in magnetic film feedback rings through three-wave nonlinear interactions
AM Hagerstrom, W Tong, M Wu, BA Kalinikos, R Eykholt
Physical review letters 102 (20), 207202, 2009
302009
Targeted chemical pressure yields tuneable millimetre-wave dielectric
NM Dawley, EJ Marksz, AM Hagerstrom, GH Olsen, ME Holtz, V Goian, ...
Nature Materials 19 (2), 176-181, 2020
282020
Tuning of chaotic surface spin waves in a magnetic-film feedback ring via the ring gain
A Hagerstrom, M Wu, R Eykholt, BA Kalinikos
Physical Review B 83 (10), 104402, 2011
222011
Physical models and dimensional traceability of WR15 rectangular waveguide standards for determining systematic uncertainties of calibrated scattering-parameters
JA Jargon, JA Jargon, DF Williams, AC Stelson, CJ Long, AM Hagerstrom, ...
US Department of Commerce, National Institute of Standards and Technology, 2020
62020
Materials characterization with multiple offset reflects at frequencies to 110 GHz
NB Popovic, AM Hagerstrom, JA Drisko, JC Booth, EJ Garboczi, CJ Long, ...
IEEE Transactions on Microwave Theory and Techniques 68 (1), 184-195, 2019
62019
Discovering, constructing, and analyzing synchronous clusters of oscillators in a complex network using symmetries
LM Pecora, F Sorrentino, AM Hagerstrom, TE Murphy, R Roy
Advances in Dynamics, Patterns, Cognition: Challenges in Complexity, 145-160, 2017
62017
Theoretical Basis of the Direct-Comparison System for Power Calibration Including Equivalent Source Mismatch
JA Jargon, JA Jargon, D Gu, CJ Long, AM Hagerstrom, AC Stelson, ...
US Department of Commerce, National Institute of Standards and Technology, 2019
42019
Characterization of transmission lines with nonlinear dielectric materials
AM Hagerstrom, E Marksz, CJ Long, JC Booth, ND Orloff
2017 90th ARFTG Microwave Measurement Symposium (ARFTG), 1-6, 2017
22017
Complete characterization of cluster synchronization in laplacian-coupled systems
F Sorrentino, LM Pecora, AM Hagerstrom, TE Murphy, R Roy
arXiv preprint arXiv:1507.04381, 2015
22015
Quantifying Receiver Nonlinearities in VNA Measurements for the WR-15 Waveguide Band
AC Stelson, AM Hagerstrom, JA Jargon, CJ Long
IEEE Transactions on Microwave Theory and Techniques 70 (5), 2743-2749, 2022
12022
Updates to the traceability of millimeter-wave power measurements at NIST
AM Hagerstrom, AC Stelson, JA Jargon, CJ Long
2021 97th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2021
12021
Broadband, High-Frequency Permittivity Characterization for Epitaxial Composition-Spread Thin Films
EJ Marksz, AM Hagerstrom, X Zhang, N Al Hasan, J Pearson, JA Drisko, ...
Physical Review Applied 15 (6), 064061, 2021
12021
Updates to the Traceability of mm-Wave Power Measurements at NIST
AM Hagerstrom, AC Stelson, JA Jargon, CJ Long
97th ARFTG Microwave Measurement Conference, 2021
12021
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