Theoretical Concepts of X-ray Nanoscale Analysis A Benediktovich, I Feranchuk, A Ulyanenkov Springer Series in Materials Science 183, 265-272, 2014 | 67 | 2014 |
Population inversion X-ray laser oscillator A Halavanau, A Benediktovitch, AA Lutman, D DePonte, D Cocco, ... Proceedings of the National Academy of Sciences 117 (27), 15511-15516, 2020 | 46 | 2020 |
Evidence of extreme ultraviolet superfluorescence in xenon L Mercadier, A Benediktovitch, C Weninger, MA Blessenohl, S Bernitt, ... Physical review letters 123 (2), 023201, 2019 | 33 | 2019 |
Observation of Seeded Mn Stimulated X-Ray Emission Using Two-Color X-Ray Free-Electron Laser Pulses T Kroll, C Weninger, FD Fuller, MW Guetg, A Benediktovitch, Y Zhang, ... Physical review letters 125 (3), 037404, 2020 | 31 | 2020 |
Quantum theory of superfluorescence based on two-point correlation functions A Benediktovitch, VP Majety, N Rohringer Physical Review A 99 (1), 013839, 2019 | 29 | 2019 |
High-resolution x-ray diffraction investigation of relaxation and dislocations in SiGe layers grown on (001),(011), and (111) Si substrates A Zhylik, A Benediktovich, A Ulyanenkov, H Guerault, M Myronov, ... Journal of applied physics 109 (12), 2011 | 27 | 2011 |
Ab initio simulation of diffractometer instrumental function for high-resolution X-ray diffraction A Mikhalychev, A Benediktovitch, T Ulyanenkova, A Ulyanenkov Journal of applied crystallography 48 (3), 679-689, 2015 | 18 | 2015 |
Generation of intense phase-stable femtosecond hard X-ray pulse pairs Y Zhang, T Kroll, C Weninger, Y Michine, FD Fuller, D Zhu, R Alonso-Mori, ... Proceedings of the National Academy of Sciences 119 (12), e2119616119, 2022 | 13 | 2022 |
Bunches of misfit dislocations on the onset of relaxation of Si0. 4Ge0. 6/Si (001) epitaxial films revealed by high-resolution x-ray diffraction V Kaganer, T Ulyanenkova, A Benediktovitch, M Myronov, A Ulyanenkov Journal of Applied Physics 122 (10), 2017 | 13 | 2017 |
Characterization of dislocations in germanium layers grown on (011)-and (111)-oriented silicon by coplanar and noncoplanar X-ray diffraction A Benediktovitch, A Zhylik, T Ulyanenkova, M Myronov, A Ulyanenkov Journal of applied crystallography 48 (3), 655-665, 2015 | 13 | 2015 |
Concentration and relaxation depth profiles of InGaAs/GaAs and GaAsP/GaAs graded epitaxial films studied by x-ray diffraction A Benediktovitch, A Ulyanenkov, F Rinaldi, K Saito, VM Kaganer Physical Review B 84 (3), 035302, 2011 | 13 | 2011 |
Stress gradient analysis by noncomplanar X-ray diffraction and corresponding refraction correction A Benediktovitch, T Ulyanenkova, J Keckes, A Ulyanenkov Advanced Materials Research 996, 162-168, 2014 | 12 | 2014 |
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures A Zhylik, A Benediktovitch, I Feranchuk, K Inaba, A Mikhalychev, ... Journal of Applied Crystallography 46 (4), 919-925, 2013 | 11 | 2013 |
Simulation of dc conductance of two‐dimensional heterogeneous system: application to carbon wires made by ion irradiation on polycrystalline diamond NA Poklonski, AA Kocherzhenko, AI Benediktovitch, VV Mitsianok, ... physica status solidi (b) 243 (6), 1212-1218, 2006 | 10 | 2006 |
Towards novel probes for valence charges via X-ray optical wave mixing C Boemer, D Krebs, A Benediktovitch, E Rossi, S Huotari, N Rohringer Faraday discussions 228, 451-469, 2021 | 9 | 2021 |
Characterization of SiGe thin films using a laboratory X-ray instrument T Ulyanenkova, M Myronov, A Benediktovitch, A Mikhalychev, J Halpin, ... Journal of Applied Crystallography 46 (4), 898-902, 2013 | 9 | 2013 |
Amplified spontaneous emission in the extreme ultraviolet by expanding xenon clusters A Benediktovitch, L Mercadier, O Peyrusse, A Przystawik, T Laarmann, ... Physical Review A 101 (6), 063412, 2020 | 8 | 2020 |
Lattice tilt, concentration, and relaxation degree of partly relaxed InGaAs/GaAs structures A Benediktovitch, F Rinaldi, S Menzel, K Saito, T Ulyanenkova, ... physica status solidi (a) 208 (11), 2539-2543, 2011 | 8 | 2011 |
Sample tilt-free characterization of residual stress gradients in thin coatings using an in-plane arm-equipped laboratory X-ray diffractometer A Benediktovitch, T Ulyanenkova, J Keckes, A Ulyanenkov Journal of applied crystallography 47 (6), 1931-1938, 2014 | 7 | 2014 |
Parametric X-rays from a polycrystalline target I Lobach, A Benediktovitch, I Feranchuk, A Lobko Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2015 | 6 | 2015 |