| On-chip aging sensor to monitor NBTI effect in nano-scale SRAM A Ceratti, T Copetti, L Bolzani, F Vargas 2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012 | 28 | 2012 |
| Identification and rejuvenation of nbti-critical logic paths in nanoscale circuits M Jenihhin, G Squillero, TS Copetti, V Tihhomirov, S Kostin, M Gaudesi, ... Journal of Electronic Testing 32, 273-289, 2016 | 23 | 2016 |
| Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM A Ceratti, T Copetti, L Bolzani, F Vargas 2012 13th Latin American Test Workshop (LATW), 1-6, 2012 | 18 | 2012 |
| Review of manufacturing process defects and their effects on memristive devices LMB Poehls, MCR Fieback, S Hoffmann-Eifert, T Copetti, E Brum, ... Journal of electronic testing 37, 427-437, 2021 | 17 | 2021 |
| An on-chip sensor to monitor NBTI effects in SRAMs A Ceratti, T Copetti, L Bolzani, F Vargas, R Fagundes Journal of Electronic Testing 30 (2), 159-169, 2014 | 17 | 2014 |
| Hierarchical identification of NBTI-critical gates in nanoscale logic S Kostin, J Raik, R Ubar, M Jenihhin, F Vargas, LMB Poehls, TS Copetti 2014 15th Latin American Test Workshop-LATW, 1-6, 2014 | 17 | 2014 |
| Analyzing the behavior of FinFET SRAMs with resistive defects TS Copetti, TR Balen, GC Medeiros, LMB Poehls 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 14 | 2017 |
| SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic S Kostin, J Raik, R Ubar, M Jenihhin, T Copetti, F Vargas, LB Poehls 2015 IEEE 18th International Symposium on Design and Diagnostics of …, 2015 | 11 | 2015 |
| Analyzing NBTI impact on SRAMs with resistive-open defects MT Martins, G Medeiros, T Copetti, F Vargas, LB Poehls 2016 17th Latin-American Test Symposium (LATS), 87-92, 2016 | 9 | 2016 |
| Evaluating the impact of process variation on RRAMs E Brum, M Fieback, TS Copetti, H Jiayi, S Hamdioui, F Vargas, ... 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 8 | 2021 |
| Validating a dft strategy’s detection capability regarding emerging faults in rrams TS Copetti, T Gemmeke, LMB Poehls 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration …, 2021 | 7 | 2021 |
| Analysing NBTI impact on SRAMs with resistive defects MT Martins, GC Medeiros, T Copetti, FL Vargas, LM Bolzani Poehls Journal of Electronic Testing 33, 637-655, 2017 | 6 | 2017 |
| Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG N Palermo, V Tihhomirov, TS Copetti, M Jenihhin, J Raik, S Kostin, ... 2015 16th Latin-American Test Symposium (LATS), 1-6, 2015 | 6 | 2015 |
| Exploring an on-chip sensor to detect unique faults in RRAMs TS Copetti, M Nilovic, M Fieback, T Gemmeke, S Hamdioui, LMB Poehls 2022 IEEE 23rd Latin American Test Symposium (LATS), 1-6, 2022 | 5 | 2022 |
| Evaluating the impact of temperature on dynamic fault behaviour of FinFET-based SRAMs with resistive defects GC Medeiros, E Brum, LB Poehls, T Copetti, T Balen Journal of Electronic Testing 35, 191-200, 2019 | 5 | 2019 |
| Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs G Medeiros, E Brum, LB Poehls, T Copetti, T Balen 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 5 | 2018 |
| Gate-level modelling of NBTI-induced delays under process variations T Copetti, G Medeiros, LB Poehls, F Vargas, S Kostin, M Jenihhin, J Raik, ... 2016 17th Latin-American Test Symposium (LATS), 75-80, 2016 | 5 | 2016 |
| Evaluating a new RRAM manufacturing test strategy TS Copetti, A Castelnuovo, T Gemmeke, LMB Poehls 2023 IEEE 24th Latin American Test Symposium (LATS), 1-6, 2023 | 4 | 2023 |
| Comparing the impact of power supply voltage on CMOS-and FinFET-based SRAMs in the presence of resistive defects T Copetti, TR Balen, E Brum, C Aquistapace, L Bolzani Poehls Journal of Electronic Testing 36, 271-284, 2020 | 4 | 2020 |
| Evaluating the impact of ionizing particles on finfet-based srams with weak resistive defects T Copetti, GC Medeiros, M Taouil, S Hamdioui, LB Poehls, T Balen 2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020 | 4 | 2020 |
