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William D. Nix
William D. Nix
Verified email at stanford.edu
Title
Cited by
Cited by
Year
Indentation size effects in crystalline materials: a law for strain gradient plasticity
WD Nix, H Gao
Journal of the Mechanics and Physics of Solids 46 (3), 411-425, 1998
47331998
A method for interpreting the data from depth-sensing indentation instruments
MF Doerner, WD Nix
Journal of Materials research 1 (4), 601-609, 1986
38891986
Mechanical properties of thin films
WD Nix
Metallurgical transactions A 20, 2217-2245, 1989
33621989
Sample dimensions influence strength and crystal plasticity
MD Uchic, DM Dimiduk, JN Florando, WD Nix
Science 305 (5686), 986-989, 2004
26772004
What is the Young's Modulus of Silicon?
MA Hopcroft, WD Nix, TW Kenny
Journal of microelectromechanical systems 19 (2), 229-238, 2010
23462010
Mechanism-based strain gradient plasticity—I. Theory
H Gao, Y Huang, WD Nix, JW Hutchinson
Journal of the Mechanics and Physics of Solids 47 (6), 1239-1263, 1999
23171999
Effects of the substrate on the determination of thin film mechanical properties by nanoindentation
R Saha, WD Nix
Acta materialia 50 (1), 23-38, 2002
18552002
Size dependence of mechanical properties of gold at the micron scale in the absence of strain gradients
JR Greer, WC Oliver, WD Nix
Acta Materialia 53 (6), 1821-1830, 2005
17652005
Interconnected silicon hollow nanospheres for lithium-ion battery anodes with long cycle life
Y Yao, MT McDowell, I Ryu, H Wu, N Liu, L Hu, WD Nix, Y Cui
Nano letters 11 (7), 2949-2954, 2011
16172011
25th anniversary article: understanding the lithiation of silicon and other alloying anodes for lithium‐ion batteries
MT McDowell, SW Lee, WD Nix, Y Cui
Advanced materials 25 (36), 4966-4985, 2013
15252013
Nanoscale gold pillars strengthened through dislocation starvation
JR Greer, WD Nix
Physical Review B 73 (24), 245410, 2006
10812006
Determination of indenter tip geometry and indentation contact area for depth-sensing indentation experiments
KW McElhaney, JJ Vlassak, WD Nix
Journal of Materials research 13 (5), 1300-1306, 1998
10441998
A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
JJ Vlassak, WD Nix
Journal of materials research 7 (12), 3242-3249, 1992
9191992
In situ TEM of two-phase lithiation of amorphous silicon nanospheres
MT McDowell, SW Lee, JT Harris, BA Korgel, C Wang, WD Nix, Y Cui
Nano letters 13 (2), 758-764, 2013
8552013
Crystallite coalescence: A mechanism for intrinsic tensile stresses in thin films
WD Nix, BM Clemens
Journal of materials research 14 (8), 3467-3473, 1999
7911999
Stresses and deformation processes in thin films on substrates
MF Doerner, WD Nix
Critical Reviews in Solid State and Material Sciences 14 (3), 225-268, 1988
7891988
Mechanism-based strain gradient plasticity—II. Analysis
Y Huang, H Gao, WD Nix, JW Hutchinson
Journal of the Mechanics and Physics of Solids 48 (1), 99-128, 2000
7522000
Measurement and interpretation of stress in aluminum-based metallization as a function of thermal history
PA Flinn, DS Gardner, WD Nix
IEEE Transactions on electron devices 34 (3), 689-699, 1987
7421987
The principles of engineering materials
CR Barrett, WD Nix, AS Tetelman
(No Title), 1973
6881973
Analysis of elastic and plastic deformation associated with indentation testing of thin films on substrates
AK Bhattacharya, WD Nix
International Journal of Solids and Structures 24 (12), 1287-1298, 1988
6671988
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