A method to automatically generate semantic skill models from PLC code A Köcher, T Jeleniewski, A Fay IECON 2021–47th Annual Conference of the IEEE Industrial Electronics Society …, 2021 | 11 | 2021 |
A Semantic Model to Express Process Parameters and their Interdependencies in Manufacturing T Jeleniewski, H Nabizada, J Reif, A Köcher, A Fay 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE), 1-6, 2023 | 3 | 2023 |
Application potentials of semantic technologies for digital twins in aircraft design, Manufacturing and maintenance MS Gill, JT Reif, TR Jeleniewski, M Weigand, A Fay | 1 | 2022 |
An Approach to Automating the Generation of Process Simulation Sequences J Reif, T Jeleniewski, A Fay 2023 IEEE 28th International Conference on Emerging Technologies and Factory …, 2023 | | 2023 |
Integrating Interdependencies in Semantic Manufacturing Process Description Models T Jeleniewski, J Reif, A Fay 2023 IEEE 28th International Conference on Emerging Technologies and Factory …, 2023 | | 2023 |
Vorschlag für eine XML-Repräsentation der Formalisierten Prozessbeschreibung nach VDI/VDE 3682 H Nabizada, TR Jeleniewski, A Köcher, A Fay | | 2022 |