Hydrogen softening and optical transparency in Si-incorporated hydrogenated amorphous carbon films GA Abbas, P Papakonstantinou, JA McLaughlin, TDM Weijers-Dall, ... Journal of applied physics 98, 103505, 2005 | 47 | 2005 |
Crystal size and oxygen segregation for polycrystalline GaN KSA Butcher, H Timmers, PTC Patrick, TDM Weijers, EM Goldys, ... Journal of applied physics 92, 3397, 2002 | 46 | 2002 |
Round Robin: measurement of H implantation distributions in Si by elastic recoil detection G Boudreault, RG Elliman, R Grötzschel, SC Gujrathi, C Jeynes, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 29 | 2004 |
Unique capabilities of heavy ion elastic recoil detection with gas ionization detectors H Timmers, TDM Weijers, RG Elliman Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 25 | 2002 |
Simultaneous hydrogen detection with an ERD gas ionization detector RG Elliman, H Timmers, TR Ophel, TDM Weijers, LS Wielunski, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2000 | 19 | 2000 |
Threshold stoichiometry for beam induced nitrogen depletion of SiN H Timmers, TDM Weijers, RG Elliman, J Uribasterra, HJ Whitlow, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 16 | 2002 |
A systematic study of the pulse height deficit in propane-filled gas ionization detectors TDM Weijers, TR Ophel, H Timmers, RG Elliman Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002 | 15 | 2002 |
Strong photosensitivity in tin-doped silica films K Gaff, A Durandet, T Weijers, J Love, R Boswell Electronics Letters 36 (9), 1, 2000 | 14 | 2000 |
The development of a stopping power predictor for ions with energies of 0.1–1.0 MeV/u in elemental targets TDM Weijers, BC Duck, DJ O’Connor Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 13 | 2004 |
Accurate depth profiling through energy-dependent pulse height deficit compensation in gas ionization detectors TDM Weijers, H Timmers, RG Elliman Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 10 | 2002 |
Stress and stress relief in dielectric thin films-the role of hydrogen RG Elliman, TDM Weijers-Dall, MG Spooner, TH Kim, AR Wilkinson Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006 | 9 | 2006 |
Hydrogen detection with a gas ionization elastic recoil detector RG Elliman, H Timmers, TDM Weijers Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 9 | 2004 |
Silicon detector response to heavy ions at energies of 1–2 MeV/amu TDM Weijers, JA Davies, RG Elliman, TR Ophel, H Timmers Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 9 | 2002 |
Oscillating cracks in glassy films on silicon substrates RG Elliman, M Spooner, TDM Dall, TH Kim, NH Fletcher Philosophical Magazine 87 (31), 4893-4906, 2007 | 8 | 2007 |
Measurements of Si ion stopping in amorphous silicon HJ Whitlow, H Timmers, RG Elliman, TDM Weijers, Y Zhang, J Uribastera, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 8 | 2002 |
Heavy ion elastic recoil detection analysis of silicon-rich silica films TDM Weijers, RG Elliman, H Timmers Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2004 | 7 | 2004 |
Measurement and uncertainties of energy loss in silicon over a wide Z1 range using time of flight detector telescopes HJ Whitlow, H Timmers, RG Elliman, TDM Weijers, Y Zhang, DJ O’Connor Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2002 | 7 | 2002 |
Origins of the residual pulse height deficit in propane-filled gas ionization detectors TDM Weijers-Dall, H Timmers, RG Elliman Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005 | 6 | 2005 |
LIGHT EMISSION FROM SILICON NANOCRYSTALS—SIZE DOES MATTER! RG Elliman Asia Pacific Nanotechnology Forum 2003, 49-52, 2004 | 5 | 2004 |
Elliman, and JA Freitas KSA Butcher, H Timmers, PPT Afifuddin, TDM Chen, EM Weijers, ... J. Appl. Phys 92, 3397, 2002 | 5 | 2002 |