Follow
Benedikt Haas
Benedikt Haas
Verified email at physik.hu-berlin.de
Title
Cited by
Cited by
Year
Growth of Nb-Doped Monolayer WS2 by Liquid-Phase Precursor Mixing
Z Qin, L Loh, J Wang, X Xu, Q Zhang, B Haas, C Alvarez, H Okuno, ...
ACS nano 13 (9), 10768-10775, 2019
1072019
Synthesis and characterization of colloidal fluorescent silver nanoclusters
S Huang, C Pfeiffer, J Hollmann, S Friede, JJC Chen, A Beyer, B Haas, ...
Langmuir 28 (24), 8915-8919, 2012
682012
Ultrathin Ga2O3 Glass: A Large‐Scale Passivation and Protection Material for Monolayer WS2
M Wurdack, T Yun, E Estrecho, N Syed, S Bhattacharyya, M Pieczarka, ...
Advanced Materials 33 (3), 2005732, 2021
652021
The influence of AlN buffer over the polarity and the nucleation of self-organized GaN nanowires
T Auzelle, B Haas, A Minj, C Bougerol, JL Rouvière, A Cros, J Colchero, ...
Journal of Applied Physics 117 (24), 2015
622015
Attribution of the 3.45 eV GaN nanowires luminescence to inversion domain boundaries
T Auzelle, B Haas, M Den Hertog, JL Rouvière, B Daudin, B Gayral
Applied Physics Letters 107 (5), 2015
552015
Atomic scale confirmation of ferroelectric polarization inversion in wurtzite-type AlScN
N Wolff, S Fichtner, B Haas, MR Islam, F Niekiel, M Kessel, O Ambacher, ...
Journal of Applied Physics 129 (3), 2021
542021
Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.
B Haas, JL Rouviere, V Boureau, R Berthier, D Cooper
Ultramicroscopy 198, 58-72, 2019
522019
Nonpolar m-plane GaN/AlGaN heterostructures with intersubband transitions in the 5–10 THz band
CB Lim, A Ajay, C Bougerol, B Haas, J Schörmann, M Beeler, ...
Nanotechnology 26 (43), 435201, 2015
462015
Atomic structure of (110) anti-phase boundaries in GaP on Si (001)
A Beyer, B Haas, KI Gries, K Werner, M Luysberg, W Stolz, K Volz
Applied Physics Letters 103 (3), 2013
462013
Highly efficient spin-to-charge current conversion in strained HgTe surface states protected by a HgCdTe layer
P Noel, C Thomas, Y Fu, L Vila, B Haas, PH Jouneau, S Gambarelli, ...
Physical Review Letters 120 (16), 167201, 2018
402018
From Fully Strained to Relaxed: Epitaxial Ferroelectric Al1‐xScxN for III‐N Technology
G Schönweger, A Petraru, MR Islam, N Wolff, B Haas, A Hammud, C Koch, ...
Advanced Functional Materials 32 (21), 2109632, 2022
302022
High-k 2D Sb2O3 Made Using a Substrate-Independent and Low-Temperature Liquid-Metal-Based Process
KA Messalea, N Syed, A Zavabeti, M Mohiuddin, A Jannat, ...
ACS nano 15 (10), 16067-16075, 2021
302021
InGaN nanowires with high InN molar fraction: growth, structural and optical properties
X Zhang, H Lourenço-Martins, S Meuret, M Kociak, B Haas, JL Rouvière, ...
Nanotechnology 27 (19), 195704, 2016
292016
European Microscopy Congress 2016: Proceedings
G Melinte, S Moldovan, D Ihiawakrim, W Baaziz, C Hirlimann, PH Cuong, ...
Wiley-VCH Verlag GmbH & Co. KGaA, 2016
252016
Microstructure and elastic constants of transition metal dichalcogenide monolayers from friction and shear force microscopy
X Xu, T Schultz, Z Qin, N Severin, B Haas, S Shen, JN Kirchhof, A Opitz, ...
Advanced Materials 30 (39), 1803748, 2018
192018
Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography
EMCB Bastien Bonef, Miguel Lopez-Haro, Lynda Amichi, Mark Beeler, Adeline ...
Nanoscale Research Letters 11, 461, 2016
19*2016
Spatial phase distributions in solution-based and evaporated Cs–Pb–Br thin films
S Caicedo-Davila, H Funk, R Lovrincic, C Müller, M Sendner, ...
The Journal of Physical Chemistry C 123 (29), 17666-17677, 2019
182019
Growth mechanism of InGaN nano-umbrellas
X Zhang, B Haas, JL Rouvière, E Robin, B Daudin
Nanotechnology 27 (45), 455603, 2016
182016
Application of transmission electron microscopy for microstructural characterization of perfluoropentacene thin films
B Haas, A Beyer, W Witte, T Breuer, G Witte, K Volz
Journal of Applied Physics 110 (7), 2011
172011
Increasing spatial fidelity and SNR of 4D-STEM using multi-frame data fusion
CM O'Leary, B Haas, CT Koch, PD Nellist, L Jones
Microscopy and Microanalysis 28 (4), 1417-1427, 2022
162022
The system can't perform the operation now. Try again later.
Articles 1–20