| Ferroelectric thin films: Review of materials, properties, and applications N Setter, D Damjanovic, L Eng, G Fox, S Gevorgian, S Hong, A Kingon, ... Journal of Applied Physics 100 (5), 051606, 2006 | 1925 | 2006 |
| Principle of ferroelectric domain imaging using atomic force microscope S Hong, J Woo, H Shin, JU Jeon, YE Pak, EL Colla, N Setter, E Kim, K No Journal of Applied Physics 89 (2), 1377-1386, 2001 | 359 | 2001 |
| Direct observation of region by region suppression of the switchable polarization (fatigue) in Pb (Zr, Ti) O 3 thin film capacitors with Pt electrodes EL Colla, S Hong, DV Taylor, AK Tagantsev, N Setter, K No Applied Physics Letters 72 (21), 2763-2765, 1998 | 259 | 1998 |
| Nanoscale Phenomena in Ferroelectric Thin Films S Hong | 168 | 2004 |
| High resolution study of domain nucleation and growth during polarization switching in Pb (Zr, Ti) O 3 ferroelectric thin film capacitors S Hong, EL Colla, E Kim, DV Taylor, AK Tagantsev, P Muralt, K No, ... Journal of Applied Physics 86 (1), 607-613, 1999 | 167 | 1999 |
| Flexible ferroelectric organic crystals M Owczarek, KA Hujsak, DP Ferris, A Prokofjevs, I Majerz, P Szklarz, ... Nature Communications 7, 13108, 2016 | 151 | 2016 |
| Coexistence of weak ferromagnetism and ferroelectricity in the high pressure LiNbO 3-type phase of FeTiO 3 T Varga, A Kumar, E Vlahos, S Denev, M Park, S Hong, T Sanehira, ... Physical Review Letters 103 (4), 047601, 2009 | 140 | 2009 |
| Origin of surface potential change during ferroelectric switching in epitaxial thin films studied by scanning force microscopy Y Kim, C Bae, K Ryu, H Ko, YK Kim, S Hong, H Shin Applied Physics Letters 94 (3), 032907, 2009 | 113 | 2009 |
| Scanning resistive probe microscopy: Imaging ferroelectric domains H Park, J Jung, DK Min, S Kim, S Hong, H Shin Applied Physics Letters 84 (10), 1734-1736, 2004 | 98 | 2004 |
| First Demonstration of a Logic-Process Compatible Junctionless Ferroelectric FinFET Synapse for Neuromorphic Applications M Seo, M Kang, S Jeon, H Bae, J Hur, BC Jang, S Yun, S Cho, W Kim, ... IEEE Electron Device Letters 39 (9), 1445 - 1448, 2018 | 89 | 2018 |
| Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy J Woo, S Hong, N Setter, H Shin, JU Jeon, YE Pak, K No Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2001 | 88 | 2001 |
| Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology H Shin, S Hong, J Moon, JU Jeon Ultramicroscopy 91 (1-4), 103-110, 2002 | 78 | 2002 |
| Imaging local polarization in ferroelectric thin films by coherent x-ray Bragg projection ptychography SO Hruszkewycz, MJ Highland, MV Holt, D Kim, CM Folkman, ... Physical Review Letters 110 (17), 177601, 2013 | 74 | 2013 |
| Screening mechanisms at polar oxide heterointerfaces S Hong, SM Nakhmanson, DD Fong Reports on Progress in Physics 79 (7), 076501, 2016 | 71 | 2016 |
| Emerging Non-Volatile Memories S Hong, O Auciello, D Wouters Springer, 2014 | 68 | 2014 |
| Effect of Ag nanoparticle concentration on the electrical and ferroelectric properties of Ag/P(VDF-TrFE) composite films H Paik, YY Choi, S Hong, K No Scientific Reports 5, 13209, 2015 | 66 | 2015 |
| Effect of cantilever–sample interaction on piezoelectric force microscopy S Hong, H Shin, J Woo, K No Applied Physics Letters 80 (8), 1453-1455, 2002 | 66 | 2002 |
| Effects of cantilever buckling on vector piezoresponse force microscopy imaging of ferroelectric domains in nanostructures R Nath, S Hong, JA Klug, A Imre, MJ Bedzyk, RS Katiyar, O Auciello Applied Physics Letters 96 (16), 163101, 2010 | 62 | 2010 |
| An eco-friendly flexible piezoelectric energy harvester that delivers high output performance is based on lead-free MASnI3 films and MASnI3-PVDF composite films S Ippili, V Jella, JH Eom, J Kim, S Hong, JS Choi, VD Tran, N Van Hieu, ... Nano Energy 57, 911-923, 2019 | 61 | 2019 |
| Intrinsically stretchable multi-functional fiber with energy harvesting and strain sensing capability J Ryu, J Kim, J Oh, S Lim, JY Sim, JS Jeon, K No, S Park, S Hong Nano Energy 55, 348-353, 2019 | 60 | 2019 |
Kwangsoo NoKAISTVerified email at kaist.ac.kr
