sedki amor
sedki amor
Micro-electronics and instrumentation
Verified email at
Cited by
Cited by
In-situ thermal annealing of on-membrane silicon-on-insulator semiconductor-based devices after high gamma dose irradiation
S Amor, N André, V Kilchytska, F Tounsi, B Mezghani, P Gérard, Z Ali, ...
Nanotechnology 28 (18), 184001, 2017
Reliable Characteristics and Stabilization of On-Membrane SOI MOSFET-based Components Heated Up to 335°C
S Amor, N André, P Gérard, SZ Ali, F Udrea, F Tounsi, B Mezghani, ... …, 2016
Trap recovery by in-situ annealing in fullydepleted MOSFET with active silicide resistor
S amor, V Kilchytska, D Flandre, P Galy.
IEEE Electron Device Letters, 2021
A low-power and in situ annealing technique for the recovery of active devices after proton irradiation
LA Francis, A Sedki, N André, V Kilchytska, P Gérard, Z Ali, F Udrea, ...
EPJ Web of Conferences 170, 01006, 2018
Low-frequency noise analysis of on-membrane MOSFET and in-situ thermal annealing
S Amor, L Van Brandt, V Kilchytska, M Machhout, LA Francis, D Flandre
2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS …, 2020
An Ultra-Thin Ultraviolet Enhanced Backside-Illuminated Single-Photon Avalanche Diode with 650nm-Thin Silicon Body Based on SOI Technology
A Iman Sabri, A Nicolas, S Amor, G Pierre, F Denis
IEEE Journal of Selected Topics in Quantum Electronics, 1-1, 2021
In-situ recovery of on-membrane PD-SOI MOSFET from TID defects after gamma irradiation
A Sedki, V Kilchytska, F Tounsi, N André, LA Francis, D Flandre
2021 Joint International EUROSOI Workshop and International Conference on …, 2021
In-situ thermal annealing technique for process and radiation-induced defects in SOI MOS devices.
S Amor
Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing
S Amor, V Kilchytska, F Tounsi, N André, M Machhout, LA Francis, ...
Solid-State Electronics 194, 108300, 2022
On-membrane PD SOI MOSFET with micro-heater for TID in-situ annealing: experiments versus Eldo and Atlas simulations
S Amor, V Kilchytska, N André, G Li, A Rebey, L Francis, D Flandre
14th International School on the Effects of Radiation on Embedded Systems …, 2018
A low-power and in situ annealing technique for the recovery of active devices after proton irradiation-7990
LA Francis, A Sedki, N Andre, V Kilchytska, P Gerard, D Flandre, F Udrea, ...
Impact of Radiations on CMOS-MEMS Sensors and a Mitigation Technique
L Francis, N André, S Amor, P Gérard, D Flandre, F Udrea
Emerging Technologies CMOS 2016, 2016
The system can't perform the operation now. Try again later.
Articles 1–12